Kioxia Corporation

Toshiba Memory Corporation

Mikio Takasugi

Shinya Takeda

Kenji Sakaue

Takeshi Nakano

Shinji Maeda

Yasuaki Nakazato

Masaru Ogawa

Hironori Nagai

Akihito Touhata

Koichi Inoue

Takumi Sasaki

Kouji Saitou

Akira Aoki

Shingo Tanimoto

Akihiko Ishihara

Minoru Uchida

Yosuke Kino

Nobuhiro Tsuji

Shunsuke Kodera

Yoshio Furuyama

Toshihiko Kitazume

Tetsuya Iwata

Hirosuke Narai

Kenichirou Kada

A memory system includes a non-volatile memory and a controller that includes a first memory and is configured to write log data to the first memory, including a history of commands for controlling the memory system. An information processing system includes the memory system and an information processing device configured to store an expected value and to transmit a signal that instructs the memory system to stop when a value of the log data transmitted from the memory system does not match the expected value. The expected value and the transmitted value are determined based on the log data of the memory system.

Memory system and information processing system

A memory system includes a semiconductor memory device, a controller configured to access the semiconductor module, a plurality of pins for connection to the outside of the memory system, the pins configured to receive and output serial data, and a test circuit. When one of the pins receives serial test data, the test circuit converts the serial test data into parallel test data, and outputs the parallel test data to the semiconductor memory device for writing therein, and when the test circuit receives parallel test data written in the semiconductor memory device, the test circuit converts the parallel test data to serial test data, and outputs the serial test data through one of the pins for test of the memory system.

Memory system including test circuit

Growing community of inventors

Kawasaki Kanagawa, Japan

Mikio Takasugi