Mitsubishi Denki Kabushiki Kaisha

Mikio Asai

Ryoichi Takagi

Masahiko Hyozo

Hiroshi Noda

Tetsuo Tada

Toshiyuki Tsujii

Ryouichi Takagi

A semiconductor test device capable of solving a problem of a conventional one in that in the resistance measurement of a semiconductor integrated circuit it was difficult for the measurement error due to contact resistance or wiring resistance to be limited within a desired amount. The present semiconductor test device includes, in a semiconductor integrated circuit having a first semiconductor switch functioning as a pullup resistor and a second semiconductor switch functioning as a pulldown resistor, a measuring circuit for bringing the first and second semiconductor switches into conduction at the same time in response to a signal fed from a control circuit, a voltage measuring circuit for measuring the voltage at a connecting point between the two semiconductor switches, and a current measuring circuit for measuring a through current flowing through the two semiconductor switches.

Test method and device for semiconductor circuit

A bare chip (1) is rectangular, and has a front surface (1a) on the center of which semiconductor elements are integrated and a back surface. Notches (2) are formed on a side of the bare chip (1) according to the kind of the semiconductor elements integrated on the bare chip (1). The notches (2) are oblong and extend through the bare chip (1) from the front surface (1a) to the back surface. For example, assuming that the notch (2) represents '1' and a portion without the notch (2) represents '0', one-bit information is obtained according to the presence or absence of the notch (2). When detection of several portions is made, binary information according to a detection result, i.e., information regarding the type of the bare chip (1), is obtained. For detection of the presence or absence of the notch (2), the bare chip (1) is irradiated with light, and then whether the light goes through the notch (2) or is intercepted by the bare chip (1) is detected. Thus, a semiconductor device which allows easy identification of its type is provided.

Semiconductor device with identification function

A semiconductor integrated device including a first circuit block, a second circuit block, a first supply interconnection connected to the first circuit block to supply power thereto, a second supply interconnection connecting the first supply interconnection to the second circuit block, and a switch inserted across the first and second supply interconnections. The switch has a structure equivalent to a plurality of switching elements disposed in parallel on a substrate. The switch is opened by a break command output from the first circuit block so that the second supply interconnection is disconnected from the first supply interconnection, thereby preventing a standby current from flowing to the second circuit block when it is unused. This can solve a problem of a conventional semiconductor integrated device in that the standby current flowing to the second circuit block wastes power even if the second block is not used.

Growing community of inventors

Tokyo, Japan

Mikio Asai