Nikon Corporation

Research Development Corporation of Japan

Nikon Engineering Co., Ltd.

Yasukawa Electric Corporation

Mikio Aoshima

Hiroshi Suzuki

Akira Adachi

Tadashi Uchida

Seishi Kudo

A light path deviation detecting apparatus has a diverging element for diverging a detection target light path into two light paths, and detects light receiving position on light receiving surfaces disposed spaced light path lengths different from each other in the diverged light paths. A tilt of the detection target light path is detected from the light receiving positions detected respectively.

Light path deviation detecting apparatus and confocal microscope

In a microscopic photometry apparatus having an optical system for photometry and an optical system for observation, there are provided a mirror having a slit for photometry, a photodetector for receiving light from the slit for photometry, a TV camera for observing an image of a sample reflected by the mirror, an image translating mechanism for translating the image of the sample, and an image rotating mechanism for rotating the image of the sample. Photometry is performed for an arbitrary position within the image of the sample by translating and rotating the image while simultaneously observing the slit for photometry and the image of the sample. Therefore, it is possible to easily and accurately perform observation and/or measurement for a microscopic object or a microscopic part of a macroscopic object, including photometry for arbitrary two points.

Microscopic photometry apparatus

Growing community of inventors

Yokohama, Japan

Mikio Aoshima