Lg Electronics Inc.

Snur & Db Foundation

Korea Advanced Institute of Science and Technology

Mikiko Ito

Taehyung Kim

Jae Sung Lee

Sangjun Park

Seong Jong Hong

Youngjun Jung

Dong Soo Lee

Hyeongseok Kim

Seungryong Cho

Seungchan Baek

Hyun Suk Yoon

Sun Il Kwon

Byungkee Lee

Jeongtae Soh

Sang Keun Park

Hyoungjoon Jo

Chan Mi Lee

An X-ray imaging apparatus includes an X-ray generator including a plurality of X-ray sources, an X-ray detector configured to detect X-rays radiated from the plurality of X-ray sources and generate a plurality of pieces of projection data, and a processor configured to apply log projection to each of the plurality of pieces of projection data, to apply weighted projection to the log-projected projection data, to apply a bidirectional ramp filter to the weighted-projected projection data, and to generate a tomographic image reconstructed based on each of the projection data to which the bidirectional ramp filter is applied.

X-ray imaging apparatus and X-ray image processing method

An X-ray detector integral with an automatic exposure control (AEC) device can include an X-ray detection part configured to detect X-rays irradiated from an X-ray source and generate X-ray image data; and an automatic exposure detection board located below the X-ray detection part and configured to generate an X-ray sensing signal for automatic exposure control based on residual X-rays which have passed by or through the X-ray detection part.

X-ray detector integral with automatic exposure control device

The present invention provides an apparatus for measuring a Depth-Of-Interaction (DOI), comprising a crystal layerof a mono layer in which a plurality of crystals for absorbing gamma rays are consecutively arranged, scintillation light detectors disposed at one end of the crystals and configured to detect scintillation light emitted from the crystal layerby the gamma rays, change means included in the crystals and configured to linearly change transmittance in a length direction of the crystals, and a control unitconfigured to calculate the DOI in the crystal layeron a basis of the first output signal and the second output signal. The scintillation light detector outputs the first output signal in one direction and the second output signal in a direction at a right angle to the one direction.

Apparatus and method for measuring depth-of-interaction using light dispersion and positron emission tomography using the same

The present invention relates to a system and method for compensating for anode gain non-uniformity in a Multi-anode Position Sensitive Photomultiplier Tube (PS-PMT), in which a compensation unit is disposed between the multi-anode position sensitive photomultiplier tube and a position detection circuit unit and configured to uniform a current signal inputted to the position detection circuit unit, thereby compensating for anode gain non-uniformity. In accordance with the present invention, the compensation unit for changing resistance is used. Accordingly, there is an advantage in that the gain non-uniformity of each of the anodes of the PS-PMT can be compensated for. Furthermore, the gain non-uniformity of each of the anodes of the PS-PMT is compensated for by changing resistance values of the variable resistances of the compensation unit. Accordingly, there is an advantage in that the interaction positions of gamma rays can be calculated more precisely.

System and method for compensating for anode gain non-uniformity in multi-anode position sensitive photomultiplier tube

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Seoul, South Korea

Mikiko Ito