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Sudbury, MA, United States of America

Mikhail Akopyan

Average Co-Inventor Count = 3.43

ph-index = 4

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 51

Mikhail AkopyanRobert A Wolff (5 patents)Mikhail AkopyanMichael C Moed (4 patents)Mikhail AkopyanAaron S Wallack (3 patents)Mikhail AkopyanLowell D Jacobson (3 patents)Mikhail AkopyanRobert Tremblay (3 patents)Mikhail AkopyanWillard P Foster (3 patents)Mikhail AkopyanLei Wang (1 patent)Mikhail AkopyanMatthew R Reome (1 patent)Mikhail AkopyanMark D Johnson (1 patent)Mikhail AkopyanMikhail Akopyan (8 patents)Robert A WolffRobert A Wolff (17 patents)Michael C MoedMichael C Moed (32 patents)Aaron S WallackAaron S Wallack (75 patents)Lowell D JacobsonLowell D Jacobson (29 patents)Robert TremblayRobert Tremblay (12 patents)Willard P FosterWillard P Foster (10 patents)Lei WangLei Wang (18 patents)Matthew R ReomeMatthew R Reome (2 patents)Mark D JohnsonMark D Johnson (1 patent)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Cognex Corporation (7 from 621 patents)

2. Cognex Technology and Investment Corporation (1 from 111 patents)


8 patents:

1. 12079978 - System and method for determining 3D surface features and irregularities on an object

2. 11176655 - System and method for determining 3D surface features and irregularities on an object

3. 10775160 - System and method for efficient surface measurement using a laser displacement sensor

4. 10074191 - System and method for determination of object volume with multiple three-dimensional sensors

5. 10041786 - System and method for efficient surface measurement using a laser displacement sensor

6. 9605950 - System and method for efficient surface measurement using a laser displacement sensor

7. 9189670 - System and method for capturing and detecting symbology features and parameters

8. 6973207 - Method and apparatus for inspecting distorted patterns

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