Universal Display Corporation

Mike Weaver

Huiqing Pang

Peter Levermore

Brian D'Andrade

Lech Michalski

A method for accelerated life testing of organic devices is provided. The lifetime of each of one or more individual organic emissive devices is measured at a non-heating current density. Based upon the measured lifetimes of the one or more devices, the device lifetime is determined for a selected luminance. An organic emissive panel is also obtained having a second organic stack that consists essentially of the one or more organic layers of the first organic stack. The junction temperature of the organic emissive panel is then determined at a heating current density. Based upon the junction temperature and the device lifetime of the one or more individual organic emissive devices, the expected lifetime of the organic emissive panel is then determined at the heating current density.

Method for accelerated lifetesting of large area OLED lighting panels

The present invention provides OLEDs incorporating microcavities. By combining a microcavity with a non-microcavity emissive layer, improved saturation and luminance may be achieved. OLEDs incorporating microcavities according to the invention may be used to produce white light, and as sub-pixels in full-color displays.

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Princeton, NJ, United States of America

Mike Weaver