Johnstech International Corporation

Mike W Andres

Melissa Hasskamp

David A Johnson

David T Skodje

Jeffrey C Sherry

Brian Sheposh

Bob Chartrand

Jason Steinblock

David Skodie

A contactor assembly for a testing system for testing integrated circuit devices includes a contact, and a housing having a contact slot. The contact is receivable in the contact slot. The contact includes a tip, a body, and a tail; and is configured to be in a free state, a preload state, and an actuated state. The housing includes a housing backstop. When the contact is in the preload state, a contact backstop of the contact is biased against the housing backstop.

Housing with vertical backstop

Anti pinching contact

Contact

Contact pin for integrated circuit testing

Test pin

A test apparatus for testing device under test (DUT) having an antenna located on the DUT is disclosed. The test apparatus includes: a housing, a socket configured to electrically connect the DUT to a load board, a gripper assembly configured to hold the DUT in place, a retractor configured to release the DUT from the gripper assembly, and an alignment plate configured to align the DUT with the socket. The gripper assembly includes a base and an extender, the base is attached to the housing, and the extender is configured to hold the DUT in place. When the retractor is disengaged from the extender, the extender is configured to hold the DUT in place. When the retractor is engaged with the extender, the extender is configured to release the DUT on the alignment plate.

Over the air (OTA) chip testing system

A contactor assembly for a testing system is disclosed. The assembly includes a contact having a contact tail and a housing having a top surface and a bottom surface. A slot extends through the housing from the top surface to the bottom surface and defines a first inner side wall of the housing and a first inner end wall. The contact is receivable in the slot. The contact tail includes a sloped terminus. A retainer is disposed on the first inner side wall. When the sloped terminus is engaged with the first inner end wall, at least a portion of the retainer overlaps with the contact forming at an overlapping area in a cross-sectional view, thereby preventing removal of the contact from the top side of the housing.

Housing with anti-dislodge capability

A high density thin walled test device testing chips/ICs is disclosed. A housing includes a slot for a contact pin and a pair of elastomers. The pin has an arcuate recess to receive part of the elastomer. Likewise the housing includes a channel to receive part of the elastomer. The recess and channel together partially surround the elastomer but not completely to allow shear forces and expansion space for the elastomer as it is compressed by the channel and recess. In addition, a front channel extends from the top surface of the housing toward the bottom surface but leaving a floor to support the elastomer so that it does not warp the housing when compressed. Further, the channel or the recess may include retainers which prevent the elastomer from moving out of position when the pin is in an uncompressed state.

Self flattening test socket with anti-bowing and elastomer retention

Growing community of inventors

Inver Grove Heights, MN, United States of America

Mike W Andres