View, Inc.

Oclaro Technology Limited

Soladigm, Inc.

Mike Scobey

Anshu A Pradhan

Zhongchun Wang

Eric William Kurman

Mark Kozlowski

Jeremy A Dixon

Robert T Rozbicki

Robert William Keys

Rad Sommer

Prior electrochromic devices frequently suffer from high levels of defectivity. The defects may be manifest as pin holes or spots where the electrochromic transition is impaired. This is unacceptable for many applications such as electrochromic architectural glass. Improved electrochromic devices with low defectivity can be fabricated by depositing certain layered components of the electrochromic device in a single integrated deposition system. While these layers are being deposited and/or treated on a substrate, for example a glass window, the substrate never leaves a controlled ambient environment, for example a low pressure controlled atmosphere having very low levels of particles. These layers may be deposited using physical vapor deposition.

Fabrication of low defectivity electrochromic devices

Prior electrochromic devices frequently suffer from poor reliability and poor performance. Some of the difficulties result from inappropriate design and construction of the devices. In order to improve device reliability two layers of an electrochromic device, the counter electrode layer and the electrochromic layer, can each be fabricated to include defined amounts of lithium. Further, the electrochromic device may be subjected to a multistep thermochemical conditioning operation to improve performance. Additionally, careful choice of the materials and morphology of some components of the electrochromic device provides improvements in performance and reliability. In some devices, all layers of the device are entirely solid and inorganic.

Electrochromic devices

An optical analyzer () for performing spectral analysis on an optical beam () includes an optical filter (), a mover (), an optical launcher (), and an optical receiver (). The optical filter () includes a filter area () that is a narrow band pass type filter having multiple alternative center bandwidths that are distributed along the filter area (). The mover () moves the optical filter (). The first optical launcher () directs the optical beam () at the filter area () so that the optical beam () is near normal incidence to the filter area (). The optical analyzer () can be used to simultaneously monitor multiple optical signals. Additionally, the optical analyzer () can include a beam redirector () that causes the optical beam () to make two passes through the optical filter ().

Optical channel analyzer with variable filter

Growing community of inventors

Santa Rosa, CA, United States of America

Mike Scobey