Nokia Corporation

Mike Jager

Erkki Nokkonen

Pasi Kolinummi

Neil Webb

Ashley Crawford

A method comprising: sensing an ambient temperature at an electronic apparatus; and switching between a first processing mode of the electronic apparatus and a second processing mode of the electronic device, in response to an increase in the ambient temperature above a threshold.

Power control using in-situ test circuit to measure performance capability of processing circuitry

A method of performing a burst read access at a memory device using a multiplexed data/address bus and a control signal including transferring a first portion of address information in a first phase via the multiplexed data/address bus to the memory device; transferring second portion of address information in a second phase via a multiplexed data/address bus to the memory device; transferring a series of data words from the memory via the multiplexed data/address bus; toggling the state of the control signal at the memory device as each data word is transferred; and suspending the transfer of the series of data words from the memory via the multiplexed data/address bus and the toggling of the state of the control signal.

Multiphase addressing method for transferring address information

A method, system, module, apparatus, use, and computer program product are shown for determining a supply voltage level for operating an integrated circuit. To allow exact voltage level calibration, a high load condition is provided to the integrated circuit, a first voltage level of the integrated circuit is adjusted to provide a stable operation of the integrated circuit in the high load condition, a temperature of the integrated circuit in the high load condition is measured, the measured temperature in the high load condition is stored along with the adjusted first voltage level in the high load condition.

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Camberley, United Kingdom

Mike Jager