Growing community of inventors

Zichron Yaakov, Israel

Mike Adel

Average Co-Inventor Count = 4.50

ph-index = 5

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 128

Mike AdelMichael Friedmann (8 patents)Mike AdelIbrahim Abdulhalim (8 patents)Mike AdelMichael Faeyrman (8 patents)Mike AdelAmir Widmann (4 patents)Mike AdelJohn Charles Robinson (3 patents)Mike AdelPavel Izikson (3 patents)Mike AdelDongsub Choi (3 patents)Mike AdelAnat Marchelli (3 patents)Mike AdelMark Davis Smith (1 patent)Mike AdelElyakim Kassel (1 patent)Mike AdelRobert Hardister (1 patent)Mike AdelMike Pochkowski (1 patent)Mike AdelMark Smith (0 patent)Mike AdelMichael Friedmann (0 patent)Mike AdelMike Adel (12 patents)Michael FriedmannMichael Friedmann (34 patents)Ibrahim AbdulhalimIbrahim Abdulhalim (13 patents)Michael FaeyrmanMichael Faeyrman (9 patents)Amir WidmannAmir Widmann (18 patents)John Charles RobinsonJohn Charles Robinson (23 patents)Pavel IziksonPavel Izikson (13 patents)Dongsub ChoiDongsub Choi (5 patents)Anat MarchelliAnat Marchelli (4 patents)Mark Davis SmithMark Davis Smith (32 patents)Elyakim KasselElyakim Kassel (3 patents)Robert HardisterRobert Hardister (1 patent)Mike PochkowskiMike Pochkowski (1 patent)Mark SmithMark Smith (0 patent)Michael FriedmannMichael Friedmann (0 patent)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Kla Tencor Corporation (11 from 1,787 patents)

2. Kla-tencor Technologies Corporation (1 from 641 patents)


12 patents:

1. 10649447 - Methods and systems for creating or performing a dynamic sampling scheme for a process during which measurements are performed on wafers

2. 10151584 - Periodic patterns and technique to control misalignment between two layers

3. 9835447 - Periodic patterns and technique to control misalignment between two layers

4. 9651943 - Methods and systems for creating or performing a dynamic sampling scheme for a process during which measurements are performed on wafers

5. 9476698 - Periodic patterns and technique to control misalignment between two layers

6. 9234745 - Periodic patterns and techniques to control misalignment between two layers

7. 9103662 - Periodic patterns and technique to control misalignment between two layers

8. 8570515 - Periodic patterns and technique to control misalignment between two layers

9. 8525994 - Periodic patterns and technique to control misaligment between two layers

10. 8175831 - Methods and systems for creating or performing a dynamic sampling scheme for a process during which measurements are performed on wafers

11. 7925486 - Computer-implemented methods, carrier media, and systems for creating a metrology target structure design for a reticle layout

12. 7656528 - Periodic patterns and technique to control misalignment between two layers

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as of
12/6/2025
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