Kabushiki Kaisha Nihon Micronics

Mika Nasu

Takashi Kawano

Tetsuya Yoshioka

Yoshihiko Otsuka

Namiko Fukatsu

Tsuyoshi Muramoto

Hiroyasu Ando

Takayuki Hayashizaki

Osamu Takeuti

Shigeki Makise

Darren Russell Aaberge

Akihiro Karouji

An electric connection device includes a probe () and a probe head (). The probe () includes: a tubular barrel (), a rod-like top-side plunger (), and a rod-like bottom-side plunger (). The top- and bottom-side plungers are connected to the barrel () with tips thereof exposed from respective open ends of the barrel (). The probe head () includes guide plates (and) which are spaced apart from each other in the axial direction of the probe () and each include a through-hole through which a body of the barrel () penetrates. A protrusion () having an outer diameter greater than the body of the barrel () is provided on the circumference of the probe (). The guide plates (and) include a support guide plate in which the through-hole has a diameter smaller than the outer diameter of the protrusion (). The probe () is supported by the support guide plate with the top-side plunger () up such that the lower section of the protrusion () is in contact with the edge of the upper opening of the through-hole of the support guide plate.

Electric connection device

A probe includes: a rod-shaped plunger () including a tip section () and an insertion section () connected to the tip section (); a tube-shaped barrel () in which the insertion section () of the plunger () is located inside; and a conductive first fixing member () which is located in an area where the plunger () and the barrel () face each other and is configured to fix the plunger () to the barrel (), the first fixing member () having a lower melting point than that of the material of both of the plunger () and the barrel (). The gap between the plunger () and the barrel () is filled with the first fixing member () without any voids in a cross section of the probe in an area where the plunger () and the barrel () overlap each other, including the area where the first fixing member () is located.

Probe

A probeelectrically connecting a first contact target to a second contact target includes a tubular barrel portion, a first plunger portionpartially inserted into a first end of the barrel portionand electrically contacting the first contact target, and a second plunger portionpartially inserted into a second end of the barrel portionand electrically contacting the second contact target. The barrel portionincludes a first barrel portionhaving an inside diameter &#x3d5;, and a second barrel portionarranged inside the first barrel portionand having an outside diameter &#x3d5;. The first barrel portionincludes a first spring portion. The second barrel portionincludes a second spring portion. The first plunger portionincludes a main body portionhaving a longer dimension than an inside diameter of the first barrel portion

Probe and electric connecting apparatus

A probe card includes a probe having a spring property and a probe head that holds the probe. The probe head includes a guide portion that holds the probe such that the probe can move in an axis direction Z. The guide portion includes a heat radiation structure that absorbs heat of the probe generated by energization and emits the heat to the outside of the probe.

Probe card and contact inspection device

Electric contact

Probe pin

Growing community of inventors

Tokyo, Japan

Mika Nasu