Samsung Electronics Co., Ltd.

Mijung Noh

Bohdan Karpinskyy

Yong Ki Lee

Yunhyeok Choi

Yongki Lee

Kyoungmoon Ahn

Yongsoo Kim

Juyeon Lee

Jaechul Park

Sang-wook Park

Jieun Park

Jonghoon Shin

Sun-Soo Shin

Yun-Ho Youm

Heonsoo Lee

An apparatus includes an integrated circuit and a plurality of conducting wires disposed on the integrated circuit. The integrated circuit includes: (i) a signal generation circuit, which is configured to generate random signal and selection signal based on random or pseudo-random numbers, (ii) a transmitting circuit configured to select at least one from among the plurality of conducting wires based on the selection signal and to output the random signal through the at least one conducting wire, and (iii) a receiving circuit configured to detect an invasive attack on the integrated circuit based on signal received through the at least one conducting wire.

Apparatus and methods for detecting invasive attacks within integrated circuits

The present disclosure relates to an integrated circuit and a method of using the integrated circuit used to perform authentication using a challenge-response method. The challenge-response method includes an internal challenge generator, a physically unclonable function (PUF) block, and a response generator. The internal challenge generator is configured to receive a challenge, generate a plurality of internal challenges corresponding to the challenge, and generate at least one valid internal challenge among the plurality of internal challenges using screen information. The physically unclonable function (PUF) block is configured to generate a plurality of valid internal responses respectively changing according to the plurality of valid internal challenges. The response generator is configured to output a response generated using the plurality of valid internal responses.

Integrated circuit performing authentication using challenge-response protocol and method of using the integrated circuit

A semiconductor device includes a physical unclonable function (PUF) cell array that includes PUF cells outputting first bits; a non-volatile memory that stores marking bits indicating whether the first bits are valid, first mask bits generated by masking second bits depending on parity of the second bits, and second mask bits generated by masking helper bits of the second bits, the second bits are valid bits from the first bits; an extracting unit that extracts the second bits from the first bits using the marking bits; an unmasking unit that unmasks the second bits using the first mask bits while receiving the second bits to provide the third bits; a bit decoding unit that compresses the third bits to fourth bits while receiving the third bits; and a block decoding unit that generates a security key by decoding the fourth bits and the second mask bits.

Semiconductor device generating security key, method of generating security key, and method of enrolling security key

A random number generator may include a first meta-stable inverter having an input terminal and an output terminal connected to each other and configured to generate a meta-stable voltage, an amplifier configured to amplify the meta-stable voltage, control circuitry configured to adjust a threshold voltage of the meta-stable voltage, and a sampler configured to generate a random number based on sampling the meta-stable voltage. The random number generator may be configured to be operated according to different modes of operation of a plurality of modes of operation. The amplifier may be a second meta-stable inverter configured to amplify the meta-stable voltage or include an input terminal and an output terminal that are connected to each other based on the random number generator being operated according to a first mode of operation or a second mode of operation, respectively, of the plurality of modes of operation.

Random number generators and methods of generating random numbers using adjustable meta-stable voltage

A method of debugging a device which includes a plurality of processors is provided. The method includes verifying a request to initiate authentication that is provided to the device to a user; performing a challenge-response authentication operation between the user and the device in response to the request to initiate authentication being a request from a non-malicious user; activating or deactivating an access to a Joint Test Action Group (JTAG) port of each of the processors, based on access control information from the user; and permitting a debugging operation via an access that is activated.

Device having secure JTAG and debugging method for the same

An access control method of a semiconductor device includes providing an inputted password as an input of a hash operator; performing a hash operation in the hash operator and outputting a first hash value; controlling the hash operator so that the hash operation is repeatedly performed in the hash operator by providing the first hash value as an input of the hash operator when the first hash value and a second hash value stored in a nonvolatile memory do not coincide; and setting an access level with respect to the inner circuit according to the repetition number of times of the hash operation of the hash operator when the first and second hash values coincide.

Growing community of inventors

Yongin-si, South Korea

Mijung Noh