Diamontech Ag

Helmholtz Zentrum Munchen Deutsches Forschungszentrum Fur Gesundheit Und Umwelt

Miguel Angel Pleitez Rafael

Otto Hertzberg

Alexander Bauer

Hermann Von Lilienfeld-Toal

Tabea Pfuhl

Werner Mäntele

Tobias Lieblein

Arne Küderle

Vasilis Ntziachristos

Werner Mantele

Arne Kuderle

Arne Kürderle

A method and apparatus for analyzing a substance is disclosed. An optical medium is arranged on a substance surface with at least one region of the optical medium surface in contact with the substance surface. An excitation light beam is emitted through the contacting region of the medium surface (to the substance surface. A measurement light beam is emitted through the optical medium to the contacting region of the medium surface such that the measurement light beam and the excitation light beam overlap on the interface of the optical medium and of the substance surface, on which the measurement light beam is reflected. A deflection of the reflected measurement light beam is detected in dependence on the wavelength of the excitation light beam. The substance is then analyzed based on the detected deflection of the measurement light beam in dependence on the wavelength of the excitation light beam.

Non-invasive substance analysis

The invention relates to a device () and a corresponding method for mid-infrared microscopy and/or analysis, the device () comprising at least one radiation unit () configured to generate radiation () of time-varying intensity, the radiation () comprising one or more wavelengths in the mid-infrared spectral range, at least one refractive and/or reflective optical unit () which is configured to focus and/or direct the radiation () to at least one region or point of interest () located on and/or with-in an object (), at least one detection unit () configured to detect ultrasound waves () emitted by the object () at the at least one region or point of interest () in response to an interaction of the radiation () with the object () and to generate according detection signals, and an evaluation unit () configured to derive infor-mation regarding at least one property of the object () from the detection signals and/or to generate a spatial and/or spatio-temporal distribution of the detection sig-nals or of information derived from the detection signals obtained for the at least one region or point of interest () located on and/or within the object ().

Device and method for mid-infrared microscopy and analysis

The invention relates to analyzing a substance. An optical medium is arrange on a substance surface with at least one region of the optical medium surface in contact with the substance surface. An excitation light beam is emitted through the contacting region of the medium surface to the substance surface. A measurement light beam is emitted through the optical medium to the contacting region of the medium surface such that the measurement light beam and the excitation light beam overlap on the interface of the optical medium and of the substance surface, on which the measurement light beam is reflected. A deflection of the reflected measurement light beam is detected in dependence on the wavelength of the excitation light beam. The substance is then analyzed based on the detected deflection of the measurement light beam in dependence on the wavelength of the excitation light beam.

Growing community of inventors

Frankfurt am Main, Germany

Miguel Angel Pleitez Rafael