Stmicroelectronics (alps) Sas

Oct Circuit Technologies International Limited

Mickael Broutin

Nicolas Anquet

Alberto Bosio

Patrick Girard

Benoit Lelievre

Miroslav Valka

Philippe Debaud

Stéphane Guilhot

Embodiments of the circuits described include a method wherein at least one command signal is activated. The activation of the at least one command signal causes a request to a testing circuit of a memory array to enter a memory test mode. The requested memory test mode permits at least part of the memory array to be read. In response to activation of the at least one command signal, a test control circuit initiates an overwrite sequence to overwrite the data stored in the memory array. The test control circuit enables the memory test mode once the overwrite sequence has been completed.

Data protection for memory with built-in self-test

Growing community of inventors

Seyssinet-Pariset, France

Mickael Broutin