Hitachi, Ltd.

Michio Yasuda

Toshihiro Hananoi

Yoshiji Fujimoto

Shozo Kadota

Shinichi Hayashi

Hiromichi Fujisawa

Yasuaki Nakano

Mitsunori Oka

In a pattern recognition device for recognizing an unknown pattern in accordance with the magnitude of the similarities between the unknown pattern and a plurality of standard patterns, the similarity between the unknown pattern and one of the standard patterns is detected as follows. Similarities are detected at first in respective shifting conditions where the unknown and standard patterns are relatively shifted from each other over the first limited extent, including the condition without the shift. The maximum value of these similarities is then detected. The similarities are further detected in respective shifting conditions where the unknown and standard patterns are relatively shifted from each other over the second extend larger than the first limited extent, when the shifting condition which gave the maximum value is that without relative shift.

Method and device for detecting the similarity between standard and

A pattern segmenting system for a pattern recognizing device, including a pattern memory for storing character information, means for reading out the character information from the pattern memory, means for detecting the start and end points of a subpattern in the character information and for calculating the center of the subpattern in accordance with the start and end points thereof, means for deciding whether or not the center thereof is within a selected character frame, and means for segmenting the subpattern when the center thereof is within the selected character frame and for regarding the frame as a blank when it is not within the selected character frame.

Pattern segmenting system for a pattern recognizing device

A character pattern recognition system is disclosed in which an unknown input pattern of character and a standard pattern of character are described and maintained in the form of a sequence of Freeman direction codes. One-to-multiple and multiple-to-one correspondence is permitted between the codes, to obtain a specific correspondence between them in which the sum of the difference between direction codes is minimum, so that the minimum value of code difference is used as a measure of determining the similarity between the two patterns.

Pattern recognition system

Growing community of inventors

Koganei, Japan

Michio Yasuda