Nidec-read Corporation

Sv Probe Technology Taiwan Co., Ltd.

Michio Kaida

Huei Che Yu

Norihiro Ota

Takashi Nakagawa

Munehiro Yamashita

Toshihide Matsukawa

Yusuke Yokota

Osamu Hikita

An inspection jig includes: film-shaped wiring substrates each having one surface provided with an electrode; a pedestal that supports the wiring substrates which are laminated such that electrode regions are exposed, the electrode region being a region where the electrode is provided in each of the wiring substrates; and a plurality of probes which have base end portions in contact with the electrode regions and extend in a direction away from the electrode regions.

Inspection jig and inspection device

In a contact terminal, the first insertion portion includes a first contact portion having a first flat surface along an axial direction, the second insertion portion includes a second contact portion having a second flat surface along the axial direction, the first flat surface and the second flat surface are in contact with each other, the tubular body includes at least one of a first end side notch provided along the axial direction on a peripheral surface of the one end portion in the axial direction of the tubular body and a second end side notch provided along the axial direction on a peripheral surface of the other end portion in the axial direction of the tubular body.

Contact terminal, inspection jig, and inspection device

An inspection jig includes contact terminals and a pitch conversion unit electrically connected to the contact terminals and configured to convert a first pitch between adjacent two of the contact terminals into a second pitch different from the first pitch. The contact terminals each include a tubular body that extends in an axial direction of the contact terminal and is electrically conductive, and a conductor that is electrically conductive and has a stick shape. The tubular body includes a spring portion that has a helical shape along a peripheral surface of the tubular body. The conductor includes an uninserted portion that protrudes from the tubular body toward a first side in the axial direction, and an inserted portion that is disposed in the tubular body and is fixed to a first axial end portion of the tubular body. The pitch conversion unit includes a board portion and a protruding portion.

Inspection jig

Provided are a probe that enables control of a bending direction and can be simply manufactured, an inspection jig using the probe, an inspection device, and a method of manufacturing the probe. A probe has a substantially bar-like shape extending linearly and includes: a tip end portion, a body portion continuous with the tip end portion Pa; and a base end portion continuous with the body portion. The body portion includes a first connection region having a thickness in a thickness direction perpendicular to an axial direction of the bar-like shape that gradually decreases away from the tip end portion, and a second connection region having a thickness that gradually decreases away from the base end portion. A dimension of the body portion in a width direction perpendicular to the thickness direction is larger than dimensions of the tip end portion and the base end portion.

Probe, inspection jig, inspection device, and method of manufacturing probe

Electric characteristic measuring probe

A flexible circuit board inspecting apparatus for conducting an inspection on a flexible circuit board includes a transport path and an inspection part mechanism. The transport path is configured to successively transport the flexible circuit board having a plurality of unit circuit boards arranged thereon. The inspection part mechanism is configured to bring and distance a jig for inspecting the flexible circuit board transported on the transport path close to and from the flexible circuit board. The transport path includes a longitudinal transport portion for transporting the flexible circuit board in a downward vertical direction. The inspection part mechanism moves the jig in a direction perpendicular to the flexible circuit board transported on the longitudinal transport portion to bring and distance the jig close to and from the flexible circuit board.

Flexible circuit board inspecting apparatus

A probe is made to contact one end of the test wiring of a circuit board , with a head electrostatically coupled to the other end of said wiring. A pulse-like DC voltage is supplied from a signal source , and, simultaneously with a switch section SWp turning on, the maximum voltage is applied to the test wiring. If a detection signal is below a specified value, then a computer will read it as &ldquo;open&rdquo; or &ldquo;shorting&rdquo;. Further, a tip of the head is associated with the circuit board only through an insulating sheet , so that the tip is kept away from each pad of a pad section on the board at a fixed distance (equivalent to the thickness of insulating sheet ). Thus, continuity testing may be performed in a non-contact manner by moving head only in X and Y directions without movement in the Z-direction.

Growing community of inventors

Kyoto, Japan

Michio Kaida