Kabushiki Kaisha Topcon

Mitsubishi Electric Corporation

Michihiro Yamazaki

Hisashi Isozaki

Hiroshi Yoshikawa

Jun Ishii

Yoichiro Iwa

Hiroyuki Maekawa

Takehiro Takase

Naohiro Takahashi

Yohei Okato

Yasushi Ishikawa

Naoto Miki

Yutaka Shida

Hiroki Sakashita

Kazuyuki Nogi

Takashi Kakinuma

Naoya Sugitani

Fumio Koda

An object is to provide a technique which can provide a highly valid recognition result while preventing unnecessary processing. A voice recognition device includes first to third voice recognition units, and a control unit. When it is decided based on recognition results obtained by the first and second voice recognition units to cause the third voice recognition unit to recognize an input voice, the control unit causes the third voice recognition unit to recognize the input voice by using a dictionary including a candidate character string obtained by at least one of the first and second voice recognition units.

Apparatus and method for decoding to recognize speech using a third speech recognizer based on first and second recognizer results

A voice recognition system includes: a voice input unitfor inputting a voice uttered a plurality of times; a registering voice data storage unitfor storing voice data uttered the plurality of times and input into the voice input unit; an utterance stability verification unitfor determining a similarity between the voice data uttered the plurality of times that are read from the registering voice data storage unit, and determining that registration of the voice data is acceptable when the similarity is greater than a threshold Tl; and a standard pattern creation unitfor creating a standard pattern by using the voice data where the utterance stability verification unitdetermines that registration is acceptable.

Voice recognition system for registration of stable utterances

A recognition dictionary creation device identifies the language of a reading of an inputted text which is a target to be registered and adds a reading with phonemes in the language identified thereby to the target text to be registered, and also converts the reading of the target text to be registered from the phonemes in the language identified thereby to phonemes in a language to be recognized which is handled in voice recognition to create a recognition dictionary in which the converted reading of the target text to be registered is registered.

Recognition dictionary creation device and voice recognition device

A light source section outputs optical flux having two types of wavelength, which are a short wavelength and a long wavelength, while the intensity is made variable. The output from the first light intensity detecting section in irradiating the optical flux having a short wavelength is compared with the output from the first light intensity detecting section in irradiating the optical flux having a long wavelength. A disappearance level near a point where the detected signal from the internal subject disappears is calculated. The first intensity of optical flux having a long wavelength is set to level higher than the disappearance level. Based on the output from the first light intensity detecting section obtained by the optical flux having a long wavelength of the first intensity, a subject inside the body to be detected is measured.

Surface inspecting method and device

A method and an apparatus of inspecting the surface of a wafer, where two or more kinds of laser are switched or mixed to make the laser incident on the film-coated wafer by a same incident angle, in which inspection data regarding an inspection apparatus and film parameters regarding a film are stored in storage means of the inspection apparatus in an associated state with each other so as to obtain predetermined inspection conditions. When performing each measurement, an operator sets the film parameters of the wafer to be measured by setting means of the inspection apparatus. Thus, desired inspection conditions are automatically set in the inspection apparatus. The film parameters that the operator sets at each measurement are a film thickness and a film refraction index.

Surface inspection method and apparatus

A surface inspection method in a surface inspection system which comprises a photodetection unit and a photodetection polarizing angle changing means, comprising the step of receiving a scattered reflection light from a substrate surface where standard particles are coated by changing a photodetection polarizing angle by the photodetection polarizing angle changing means, and the step of performing surface inspection by setting the photodetection polarizing angle to a condition where an S/N ratio of photodetection output is at the highest.

Surface inspection method and surface inspection system

A surface inspection apparatus comprises: a light source section that emits a first luminous flux and a second luminous flux; an irradiation optical system that irradiates the first luminous flux and the second luminous flux on the surface of the film-coated inspection subject; a displacement section that relatively displaces the film-coated inspection subject and an irradiation luminous flux from the irradiation optical system; a light-receiving optical system that receives scattered light generated from the inspection subject on the film-coated inspection subject after irradiation of the first luminous flux from the irradiation optical system and scattered light generated from the inspection subject on the film-coated inspection subject after irradiation of the second luminous flux from the irradiation optical system; a first light-receiving section that transforms the scattered light of the first luminous flux received by the light-receiving optical system into a first light reception signal; a second light-receiving section that transforms the scattered light of the second luminous flux received by the light-receiving optical system into a second light reception signal; and a sensitivity stabilizing section that synthesizes the first light reception signal and the second light reception signal to form a signal for sampling.

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Tokyo, Japan

Michihiro Yamazaki