Raytheon Company

Michelle Moholt

Nick Angelo

William T Jennings

Colby Hoffman

Ashish Mody

An electronic device is provided having a bulk Si layer and an active region positioned on the bulk Si layer. The active region includes at least one semiconductor component defined by a device layout or functions of the electronic device. An opaque structure is positioned on the bulk Si layer or within the bulk Si layer. The opaque structure is configured to prevent visual or IR imaging of the electronic device to determine the device layout or functions.

Backside metallization of flip-chip semiconductor devices

A method of controlling access to a network includes receiving, from a node, a request to access the network. A challenge is sent to the node, the challenge configured to elicit a node fingerprint from the node. The node fingerprint is based on the challenge and on unique characteristic data of a physically unclonable function (PUF), at the node. An expected fingerprint is generated for the node based on the challenge and on characteristic data information associated with the unique characteristic data of the PUF. The characteristic data information is accessed from a location that is independent of and separate from the node. The node is authenticated to the network, to allow the node to access to the network, if the received node fingerprint matches the expected fingerprint. The first node is denied any access to the network if the received node fingerprint does not match the expected fingerprint.

Hardware based authentication and authorization of networked nodes

Generally discussed herein are systems, devices, and methods for device verification. A method can include providing, by test equipment (TE), electrical stimulus consistent with a challenge of a challenge response pair (CRP) to a physical unclonable function (PUF) of a device under test (DUT), receiving, by the TE and from the DUT, a response to the electrical stimulus, comparing, by the TE, the provided response to responses to CRPs in a database including PUF CRPs associated with a device identification and a device type, and validating the identity of the DUT when the response of the PUF to the electrical stimulus matches the response of the CRP or invalidating the identity of the electrical device when the response of the PUF does not match the response of the CRP.

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Celina, TX, United States of America

Michelle Moholt