Inter Science Gmbh

Michelle D Simkulet

Jason Eugene Smith

Steven Charles Aceto

Adolfo O Gutierrez

Jiayin Ma

A device, system and method integrating forward and panoramic fields is disclosed, comprising: a primary reflector, comprising a convex surface in relation to the forward field, reflective on at least part of the convex surface; a secondary reflector, forward of the primary reflector relative to the forward field, reflective on at least part a surface thereof facing rearward toward the primary reflector; a primary reflector hole in the primary reflector, substantially centered about an optical axis of the apparatus; and a secondary reflector hole in the secondary reflector, substantially centered about the optical axis.

Integrated panoramic and forward optical device, system and method for omnidirectional signal processing

An improved microsystems testing and characterization system which allows the system user to identify specific structures, and thereby to initiate an automated testing sequence to be applied to that structure or a series of structures. The integrated control system that governs the present invention automates the power supply to the device under test, the precision motion control of all components, the sensor operation, data processing and data presentation. Therefore operation is autonomous once the microstructure is in place and the testing sequence is specified. The integrated testing system can be used to perform tests on an entire wafer or on a single die.

Microsystems integrated testing and characterization system and method

An improved microsystems testing and characterization system which allows the system user to identify specific structures, and thereby to initiate an automated testing sequence to be applied to that structure or a series of structures. The integrated control system that governs the present invention automates the power supply to the device, the precision motion control of all components, the sensor operation, data processing and data presentation. Therefore operation is autonomous once the microstructure is in place and the testing sequence is specified. The integrated testing system can be used to perform tests on an entire wafer or on a single die.

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Cohoes, NY, United States of America

Michelle D Simkulet