Cypress Semiconductor Corporation

Matra Hachette Sa

Michel J Campmas

Christopher W Jones

Gai-Bing Chen

William A Johnston

A programmable logic device comprising one or more memory circuits configured to check a cyclic redundancy check (CRC) value of an input and generate a CRC for an output.

FIFO with CRC in a PLD

In accordance with the present invention, a system and method for converting an implementation of a logic description describing a field programmable device into an implementation of the same logic in a factory-programmed device are provided. In one embodiment of the present invention, an expert system synthesizes a logic circuit model based on the logic description. An automatic test pattern generator provides test vectors including expected response signals for the logic circuit model generated by the expert system. The automatically generated test vectors are provided to a tester which applies the test vectors as input stimuli to the field programmable device. The output signals of the field programmable device are verified against the expected response signals. If the output signals of the field programmable device match the expected response signals, the computer model is considered correct, and mask layout may begin for the building a mask-programmable circuit which performs the functions described in the logic description.

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Palo Alto, CA, United States of America

Michel J Campmas