International Business Machines Corporation

Globalfoundries Inc.

Michel H Joseph

Gerald Stanquist

Brian Walter Stocker

Rohan A Jones

Marc Henri Coq

Jason Hirst

Richard W Gregory

Anthony George Gorey

Anthony G Gorey

Matthew Gadzinski

Kurt J Leuchten

A fulfillment test of a computing system having components is performed within a build-to-order test phase. Responsive to the fulfillment test failing, the component that most contributed to the fulfillment test failing is replaced, regardless of whether the given component was determined to be suspect or marginally defective pursuant to a fabrication test previously performed within a build-to-plan test phase. Any other component of that contributed to the fulfillment test failing and that was determined to be suspect or marginally defective pursuant to the fabrication test previously performed within the build-to-plan test phase is also replaced.

Replacement of suspect or marginally defective computing system components during fulfillment test of build-to-order test phase

An apparatus includes a system test module that initiates a system power test for a computer system. The computer system includes one or more power supplies that provide power to system components. The system power test includes determining power system characteristics under various loading conditions. The apparatus includes a configure module that configures a system component during the system power test. The system component uses a higher amount of power after being configured than in a previous un-configured condition. The apparatus includes a de-configure module that de-configures the system component during the system power test. The system component uses a lower amount of power after being de-configured than in a previous configured condition. The apparatus includes a diagnostic module that measures power system performance of the computer system during varying loading conditions caused by configuring and de-configuring one or more system components by the configure module and the de-configure module.

Varying power load conditions on systems under test

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Poughkeepsie, NY, United States of America

Michel H Joseph