Dilor

Institut National De La Sante Et De La Recherche Medicale

Jobin Yvon S.a.

Michel DelHaye

Edouard Da Silva

Bernard Roussel

Jacques Barbillat

Michel Leclercq

Yves J Moschetto

Gerard Martinez

Paul Dhamelincourt

An inelastic diffusion spectrometric imaging apparatus includes an illuminating and energising system including a confocal first aperture and a second confocal aperture combined with the first. A first deflector assembly scanning for scanning a sample and a second deflector assembly sychronised with the first, are placed respectively downstream and upstream of the second confocal aperture and a spectrometer. The input aperture of the spectrometer merges with the second confocal aperture.

Spectrometric imaging apparatus

In an optical fittering device comprising at least two fitters, the first filter (EF1) is tilted by an angle of incidence whose value is adjusted to bring the cut-off limit of the first filter (EF1) closer to one of the sides of the line of the illumination beam (FLA), which reduces the optical density of the first filter, while the association in series of the first (EF1) and second (EF2) filters enables to obtain a high-pass filtering whose global density corresponds to the sum of the densities of the first and second filters and whose cut-off limit is lower than that obtained by a single filter tilted to its optimum angle. A third filter (EF3) mounted in parallel with respect to the first and second filters (EF1 and EF2) enables to obtain, at the level of the common collection path (TCC), a band eliminating filtering whose cut-off limits are positioned on either side of the illumination line with a view to an optimum analysis of the low frequency lines.

Process and device for optimizing the position and the width of the

The spectrometry apparatus of the present invention includes, in addition to conventional analysis, a first diaphragm having a first chosen variable aperture for spatially filtering a coherent-excitation beam. The apparatus also includes a first deflector stage (DF1) for sweeping an excitation beam over a sample according to a first chosen deflection. Additionally, there is included a second diaphragm having a second variable aperture conjugate with the first aperture for filtering the incoherent-scattering beam. The spectrometry apparatus further provides a second deflector stage placed downstream in order to sweep the spectral image of the incoherent-scattering beam thus filtered over the multichannel detection module according to a second chosen deflection.

Spectrometry apparatus

A sample which is exposed to excitation radiation scatters light to a separator filter. The scattered light includes a Raman spectrum. The separator filter reflects, a spectral band of the radiation which it receives and transmits, the remainder of the radiation which it receives. The reflected spectral band is centered on the excitation radiation. The spectral band is collected and guided to a band-eliminating filter in order to eliminate therefrom a spectral band which is narrower than the reflected spectral band, and which embraces the wavelength of the excitation radiation. The band-eliminating filter has a steep elimination slope. A signal corresponding to the reflected spectral band, from which the narrow band has been eliminated in this way, is combined with the radiation transmitted by the separator filter and the combined radiations are supplied to a detection and analysis unit.

Combined complementary filtering spectrum analysis device, in particular

The filtration means filter the exciter radiation (EX) in a first forward direction from generator means (LS) to the specimen (EC), by allowing a second spectral band (BZ) of predetermined spectral width (l) and centered on a selected frequency corresponding to the wavelength of the exciter radiation (L0) to pass and stopping a first spectral band (FZ) complementary to the second spectral band (BZ), while substantially simultaneously with this first filtration operation, these filtration means further filter the analysis radiation (ON) in a second direction that is the reverse of the first direction, by allowing the first spectral band (FZ) to pass and stopping the second spectral band (BZ).

Spectral-band filtration spectrometry apparatus

The present invention relates to an apparatus for the non-destructive examination of an heterogeneous sample by analysis of the Raman radiations scattered by the sample receiving an incident of monochromatic radiation of known frequency. The apparatus includes a source of monochromatic light, such as a laser beam, a monochromator for selecting and measuring the change in frequency of the Raman scattered or re-emitted radiations with respect to the frequency of the incident radiation, a radiation detector and an amplifier to amplify signals from the detector. The apparatus identifies each such re-emitted radiation by comparison with control samples or reference spectra. The invention enables selective mapping of the distribution of the polyatomic ions, crystals and molecules of the sample. Apparatus embodying the invention permits mapping, by micrographic images, of the components of geological samples, composite materials, plastic materials, biological samples, microscopic preparations and the like, by isolating in the Raman spectrum the radiations characterizing the components.

Growing community of inventors

Villeneuve d'Ascq, France

Michel DelHaye