International Business Machines Corporation

Michael Werner Beattie

Byron Lee Krauter

Hui Zheng

Anirudh Devgan

Kevin Beattie, Legal Representative

A method of modeling electromagnetism in an irregular conductive plane, by dividing the surface into a grid of unequal and unaligned rectangles, assigning a circuit node location to a center of each rectangle, and calculating capacitive and inductive parameters based on the center circuit node locations. Rectangulation is accomplished using automated, recursive bisection. Capacitive segments are assigned to each circuit node and coincide with the corresponding rectangles. Inductive segments are assigned between adjacent rectangle pairs, with a width of an inductive segment defined as the common boundary of the corresponding pair of rectangles and the length of the inductive segment defined as the normal distance between circuit nodes of the two rectangles. Placement of the circuit nodes at the centers of the rectangles significantly reduces the number of nodes and segments, and provides a faster yet comprehensive analysis framework.

Efficient electromagnetic modeling of irregular metal planes

A computer implemented method, data processing system, and computer usable program code are provided for reducing a chip package model. Responsive to receiving the chip package model, an inductance and a resistance of the chip package model is measured. The inductance and the resistance are measured using only a set of external nodes of the chip package model. A reduced node resistor model and a reduced node inductor model are created using the inductance and the resistance of the chip package model. A combined reduced node resistor-inductor chip package model is formed by combining the reduced node resistor model and reduced node inductor model.

Compact chip package macromodels for chip-package simulation

A method, system, and product are disclosed for determining a voltage drop across an entire integrated circuit package. A geometric description of the entire integrated circuit package is determined. The description is subdivided into non-uniform areas. A resistance of each one of the non-uniform areas is determined. A resistive netlist of the entire integrated circuit package is then determined by combining the resistance of each one of the non-uniform areas. The package is then simulated utilizing the netlist to determine the voltage drop across the entire integrated circuit package.

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Austin, TX, United States of America

Michael Werner Beattie