General Electric Company

Michael Wayne Fields

Michael L Dziech

Joseph Anthony Traxler

Jon Russel Dierdorf

Anthony William Mellors

James Michael Johnson

An eddy current inspection apparatus includes a holder for a specimen, a holder for an eddy current probe, and an eddy current instrument operatively joined thereto. The probe holder includes carriages for translating the probe along first and second axes. The probe holder is selectively moved to align the probe with an internal channel of the specimen for sliding movement therealong to conduct eddy current inspection thereof.

Internal eddy current inspection

A rotor disk is inspected using an inspection apparatus including an inspection fixture which has a base, and at least one guide extending from the base. Each guide is slidably engagable to one of the rotor slots of the rotor disk and has a guide side shaped to slidably conform to the rotor slot side, and a guide bottom having a guide bottom surface which, in combination with a slot bottom surface, defines an elongated inspection cavity extending parallel to the axis of revolution of the rotor disk. The inspection fixture is mated to the rotor disk such that each guide slides into one of the rotor slots. A sensor apparatus includes a sensor, such as an eddy current sensor, sized to slide into the inspection cavity with a close facing relation thereto, and a sensor drive that moves the sensor parallel to a direction of elongation of the inspection cavity. Inspection is performed by inserting the sensor into the inspection cavity, and sensing the rotor slot bottom using the sensor.

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Loveland, OH, United States of America

Michael Wayne Fields