Johnstech International Corporation

Michael W Andres

David A Johnson

Jeffrey C Sherry

John E Nelson

Sarosh M Patel

Brian Halvorson

John DeBauche

Brian Eshult

Dan Campion

Steve Rott

Neil Graf

Ranauld Perez

Kenna Pretts

David T Skodje

A high density thin walled test device testing chips/ICs is disclosed. A housing includes a slot for a contact pin and a pair of elastomers. The pin has an arcuate recess to receive part of the elastomer. Likewise the housing includes a channel to receive part of the elastomer. The recess and channel together partially surround the elastomer but not completely to allow shear forces and expansion space for the elastomer as it is compressed by the channel and recess. In addition, a front channel extends from the top surface of the housing toward the bottom surface but leaving a floor to support the elastomer so that it does not warp the housing when compressed. Further, the channel or the recess may include retainers which prevent the elastomer from moving out of position when the pin is in an uncompressed state.

Self flattening test socket with anti-bowing and elastomer retention

The terminals of a device under test (DUT) are temporarily electrically connected to corresponding contact pads on a load board by a series of electrically conductive pin pairs. The pin pairs are protected against damage from balls on a DUT by a protective ball guide which includes recesses for receiving part of the ball but prevents the ball from driving the pins beyond a limited range. The ball guide provides fine alignment horizontally and vertically enabling stable electrical performance.

Integrated circuit contactor for testing ICs and method of construction

A test socket () for a testing an integrated circuit () with controlled impedance while maintaining the structural integrity of the test pins (). The pin () can have a sidewall with a thick portionand a thinner portion () along the length of the pin. The pin can have projections () which provide a standoff from the slot (). The sidewalls themselves can have projections or lands () which extend into the slot and provide stability for the pin ().

High isolation contactor with test pin and housing for integrated circuit testing

This disclosure relates to a method of fabrication contact pinsused in testing circuit components, typically integrated circuits and the contact pins themselves. It is desirable to selectively radius certain portions of each pin to achieve desired performance of the entire pin. The portion to be radiused is cut to the desire shaped from a blank material. The portion which is not to be radiused is not cut to its final shape from the blank but to a larger shape which includes the material for the final shape. The entire cut portion is then treated to shape tor round all exposed edges. Then the remaining portion of the pin is cut out from the larger blank area which was previously retained, leaving those portions with non-radiused edged.

Selectively geometric shaped contact pin for electronic component testing and method of fabrication

The test system provides an array of test probes. The probes pass through a first or upper probe guide retainer which has a plurality of slot sized to receive the probes in a way that they cannot rotate. A plurality of flex circuits at the different heights engage bottom probe ends at their respective height levels and flex circuits continue the electrical connection from the probes to a load board. The test probes are bonded to the flex circuits by ring shaped flowable conductive material. The flex circuits are biased against a load board by an elastomeric pad of spaced part conical projections.

Testing apparatus and method for microcircuit testing with conical bias pad and conductive test pin rings

A contact for use in a test set which can be mounted to a load board of a tester apparatus. The contact, which serves to electrically connect at least one lead of a device being tested with a corresponding metallic trace on the load board, has a first end defining multiple contact points. As the test pin is rotated about an axis generally perpendicular to a plane defined by the contact, successive contact points are sequentially engaged by a lead of the device being tested. The test pin has a hard stop edge which engages a hard stop wall which limits its rotation movement. The bottom of the pin has a shallow convex curvature preferably with a flat region and the tip of the test pin has a chisel edge.

Low resistance low wear test pin for test contactor

A structure and method for providing a contact pin between a device under test (DUT) and a load board which provides upper and lower contact point which are axial aligned is disclosed. The pin has an upper () and lower () section and a hinge () in between which allow flex of both upper and lower contact () which, but the axial alignment can provide a direct replacement for POGO pins but with greater reliability. It also includes a structure and method for removing upper pinsby use of a modified hinge

On-center electrically conductive pins for integrated testing

This disclosure relates to a method of fabrication contact pinsused in testing circuit components, typically integrated circuits and the contact pins themselves. It is desirable to selectively radius certain portions of each pin to achieve desired performance of the entire pin. The portion to be radiused is cut to the desire shaped from a blank material. The portion which is not to be radiused is not cut to its final shape from the blank but to a larger shape which includes the material for the final shape. The entire cut portion is then treated to shape or round all exposed edges. Then the remaining portion of the pin is cut out from the larger blank area which was previously retained, leaving those portions with non-radiused edged.

The test system provides an array of test probes having a cross beam. The probes pass through a first or upper probe guide retainer which has a plurality of slot sized to receive the probes in a way that they cannot rotate. The probes are biased upwardly through the retainer by an elastomeric block having a similar array of slots. The elastomer is then capped at its bottom by a second or lower retainer with like slots to form a sandwich with the elastomer therebetween. The bottom ends of the probes are group by probe height. A plurality of flex circuits at the different heights engage bottom probe ends at their respective height levels and take continue the circuits to a probe card where test signals originate.

Testing apparatus and method for microcircuit and wafer level IC testing

A structure and method for providing a contact pin between a device under test (DUT) and a load board which provides upper and lower contact point which are axial aligned is disclosed. The pin has an upper () and lower () section and a hinge in between which allow flex of both upper and lower contact () which, but the axial alignment can provide a direct replacement for POGO pins but with greater reliability. It also includes a structure and method for removing upper pinsby use of a modified hinge. In an alternate embodiment, the lower section includes a leg extensionand a sliding contact landwhich slides against an aperture in the housing. A spacerprovides space for decoupling components on the load board. The hinge may include a truncated cylinderwhich is configured to permit remove of the upper pin without removal of the lower.

Growing community of inventors

Inver Grove Heights, MN, United States of America

Michael W Andres