Massachusetts Institute of Technology

Michael Switkes

Mordechai Rothschild

Theodore M Bloomstein

A detection system includes a retroreflector and a layer of material over the retroreflector, the material being subject to change in transmission with respect to an optical property of radiation, e.g. wavelength or polarization, with exposure to a phenomenon. The retroreflector and layer are illuminated from a radiation source of multiple aspects of the optical property. A sensor senses radiation retroreflected back through the layer. The retroreflector may, for example, be an array of or individual prisms or an array of or individual cat's eye microspheres. The layer of material above the retroreflector can include a colorimetric dye. In an embodiment, the retroreflector and layer are on the surface of a carrier that moves through a medium, e.g. a projectile or vehicle moving through the air. In a method of detecting a phenomenon, retroreflective elements are distributed in an array, as in the atmosphere or across a region of ground.

Retroreflectors for remote detection

An interference projection system for use with lithography using quasi-coherent sources, which has a non-diffractive beam splitting module and a non-diffractive module to cause interference of two or more beams, the modules combining to form interfering beams having the same orientation on a target surface. Two etalons are used to split a beam, to form two beams of the same orientation, strength and polarization. One or more pairs of mirrors cause the beam to interfere.

Growing community of inventors

Somerville, MA, United States of America

Michael Switkes