Massachusetts Institute of Technology

Other

Cascade Microtech, Inc.

Umech Technologies

Michael Stephen Mermelstein

Daniel Feldkhun

Lyle G Shirley

Charles Cameron Abnet

Abraham McAllister

Cameron Abnet

Improved methods and systems for imaging are provided. Specifically, systems and methods for extending the range of a digital zoom are provided in which an imaging system provides continuous magnification over a plurality of interleaved optical pathways and digital zooming imagers. Systems and methods of centering an image as the field of view changes, and for masking out undesirable obstacles from a magnified image are also provided.

Optically enhanced digital imaging system

A method and apparatus for measuring motion of an object substantially orthogonal to an optical axis of an interferometer. The method includes the steps of obtaining a first interferogram and a second interferogram, wherein each of the first and second interferograms includes intensity information of each of at least two pixels, and determining the motion of the object from the first and the second interferograms in response to the difference of the intensity gradients of the pixels in the first and second interferograms in the orthogonal direction. The system includes a first interferogram including intensity information of each of at least two pixels and a second interferogram including intensity information of each of at least two pixels. The system also includes a gradient processor calculating the intensity gradients of the first and second interferograms in the orthogonal direction and a motion processor calculating the motion of the object from the first and the second interferograms in response to the difference of the intensity gradients of the first and second interferograms in the orthogonal direction.

Method and apparatus for measuring motion

Microscopic motions of a target are measured by illuminating the target, receiving the image of the illuminated target, and controlling illumination with a computer. The real-time image of the illuminated target may be displayed.

Microscopic motion measuring

Optical synthetic aperture array

A synthetic aperture system for producing a non-periodic pattern in a region of overlap. The system includes a source of electromagnetic radiation producing a plurality of electromagnetic beams, a plurality of beam controllers positioned to receive a respective one of the plurality of electromagnetic beams and direct the respective electromagnetic beam into the region of overlap; and a system controller in electrical communication with each of the plurality of the beam controllers. Each beam controller controls at least one of the phase, amplitude and polarization of a respective one of the plurality of electromagnetic beams in response to control signals from the system controller. The result is a non-periodic pattern formed within the region of overlap by the interference of a plurality of electromagnetic beams in response to the control signals from the system controller. The invention also relates to a method for producing a non-periodic pattern in a region of overlap. The method includes the steps of providing a plurality of electromagnetic beams, directing the plurality of electromagnetic beams into the region of overlap, and modulating at least one of the phase, amplitude and polarization of at least one of the plurality of electromagnetic beams to thereby form a predetermined non-periodic pattern in the region of overlap by the interference of the plurality of electromagnetic beams.

A multiple beam pair optical imaging apparatus includes a multiple beam pair generator and an illuminator. The illuminator is provided for illuminating an object with a first illumination comprising an interference pattern of modulated basis vectors arising from the multiple beam pairs. A detector is provided for detecting a characteristic of a second illumination received from the object in response to the first illumination. A processor is provided in electrical communication with the detector that calculates the coefficients of interaction of the object with the modulated basis vectors in response to the characteristic of the second illumination and the pattern of the modulated basis vectors.

Multiple beam pair optical imaging

Apparatus and methods of measuring position information, typically the depth coordinate, of a point on the surface of an object. In one embodiment, the apparatus includes two sources of radiation positioned to illuminate the point on the surface of the object with radiation from each of the sources. The radiation from each of the sources is coherent with respect to the radiation from the other source. A control system changes the phase of the radiation from at least one of the sources relative to the phase of the radiation from the other source as measured at the point on the surface of the object. A detector is positioned to receive radiation scattered by the point and a processor, in communication with the detector, calculates position information in response to the change in phase of the radiation from the source and the received radiation scattered by the point on the surface of the object.

Growing community of inventors

Cambridge, MA, United States of America

Michael Stephen Mermelstein