Schott Ag

Bam Bundesanstalt Fuer Materialforschung Und-pruefung

Michael Stelzl

Andreas Ortner

Uwe Kolberg

Joseph S Hayden

Holger Wegener

Hilmar Von Campe

Axel Engel

Klaus Gerstner

Ute Resch-Genger

Katrin Hoffmann

Rainer Haspel

Frank Macherey

Doris Ehrt

Bruno Schrader

An apparatus for identifying defects within the volume of a transparent sheet, such as a glass sheet, is provided. The apparatus includes an illumination device that directs incident light onto at least a portion of a surface of the sheet so as to illuminate the sheet, and an image detector onto which the light backscattered from the sheet is directed to image the sheet. The apparatus generates at least two interference images under different capturing conditions in order to perform identification of defects by evaluating the at least two interference images.

Apparatus and method for identifying defects within the volume of a transparent sheet and use of the apparatus

A method and an apparatus for detecting cracks in semiconductor substrates, such as silicon wafers and solar cells, are provided. The method and apparatus are based on the detection of light deflected at a crack.

Method and device for detecting cracks in semiconductor substrates

A method and device generate digital still pictures of wafer-shaped elements, such as wafers or solar cells, which are transported in series on a conveyor belt during a production process. The device has a camera taking pictures of the wafer-shaped elements in sections step-by-step, in particular continuously taking digital pictures line-by-line (linear scanning) transverse to the transport direction, and then sampling the recorded image data. The device also includes a hardware-based image data processing unit, e.g. FPGA, for detecting edges of the wafer-shaped elements that indicate a beginning or an end of each of the wafer-shaped elements. The edge detection is for controlling the generation of the digital still pictures for visual inspection to find defective areas of the elements.

Method and device for generating digital still pictures of wafer-shaped elements during a production process

The invention discloses a standard for referencing luminescence signals, having an optically transparent base material comprising a lanthanum phosphate glass, a fluorophosphate glass, a fluor-crown glass, a lanthanum glass, a glass-ceramic formed therefrom or a lithium aluminosilicate glass-ceramic, the base material including a bulk doping with at least one constituent which is luminescent and comprises at least one rare earth and/or a nonferrous metal, in particular cobalt, chromium or manganese.

Standard for referencing luminescence signals

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Mainz, Germany

Michael Stelzl