Nxp B.v.

Michael Schoeneich

Robert Meyer

Thomas Preisner

A method includes receiving a first signal at an input of a device driver included at an electronic device, the first signal representing first information. A second signal representing the first information is provided at an output of the device driver. The output of the device driver, under normal operating conditions, is coupled to an output terminal of the electronic device. A third signal at the output terminal is received at feedback circuitry of the electronic device. The feedback circuitry identifies a fault at the output terminal based on the third signal and the first signal.

Method for identifying a fault at a device output and system therefor

A system includes a magnetic field sense element for detecting an external magnetic field and a magnetic field source proximate the magnetic field sense element for providing a reference magnetic field. The magnetic field sense element produces a composite signal having reference and measurement signal portions, the reference signal portion being indicative of the reference magnetic field and the measurement signal portion being indicative of the external magnetic field. A power supply provides a supply current through the magnetic field source for continuously generating the reference magnetic field while the system is in an operational mode. A processing circuit processes the composite signal to produce a measurement output signal indicative of the external magnetic field. A qualification circuit, coupled with the processing circuit at multiple test points, detects the reference signal portion at the multiple test points and determines operability of the system from the detected reference signal portion.

System and method for sensor diagnostics during functional operation

A sensor system for sensing a physical quantity is disclosed. The sensor system includes a first sensor path comprising a first first sensing element and a second first sensing element and a first intermediate node being provided in between the first first sensing element and the second first sensing element. The sensor also includes a second sensor path comprising a first second sensing element and a second second sensing element and a second intermediate node being provided in between the first second sensing element and the second second sensing element. A third sensor path is provided and comprises a first third sensing element and a second third sensing element and a third intermediate node being provided in between the first third sensing element and the second third sensing element. A signal processing device is also included.

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Hamburg, Germany

Michael Schoeneich