Friedrich-Schiller-Universitat Jena

Leibniz-Institut Fur Photonische Technologien E.v.

Michael Schmitt

Jens Limpert

Stefan Nolte

Jürgen Popp

Tobias Meyer-Zedler

Roland Ackermann

An exemplary laser microscope can be provided, comprising at least one first laser source which emits at least one (e.g., pulsed) excitation beam, a scanning optical configuration (e.g., configured to scan the excitation beam over the surface of a sample), a focusing optical configuration (e.g., configured to focus the excitation beam onto the sample), and at least one detector configured to detect light emitted by the sample due to an optical effect in response to the excitation beam. A second laser source facilitates a pulsed ablation beam for a local ablation of the material of the sample. The ablation beam can be guided to the sample via the scanning and focusing optical configurations. The first and second laser sources can be fed by a mutual continuous wave pump laser and/or a mutual pulsed pump laser. The first laser source can emit pulses with at least two different wavelengths.

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Jena, Germany

Michael Schmitt