Infineon Technologies Ag

Michael Schlueter

Andre Uhlemann

Stefan Hubert Schmies

A snubber circuit includes a snubber substrate including an electrically insulating carrier and an electrically conducting structured layer applied thereon, the electrically conducting structured layer including two segments. The snubber circuit further includes two electrically resistive layers, each resistive layer being applied onto the two segments of the electrically conducting structured layer of the snubber substrate, and a capacitor disposed on the electrically resistive layers and having two terminals, each terminal being electrically connected to one of the electrically resistive layers. Further, a power semiconductor module having such a snubber circuit is disclosed.

Snubber circuit and power semiconductor module with snubber circuit

A semiconductor module arrangement includes an input stage including a first output terminal and a second output terminal, wherein a first inductive element is coupled to the first output terminal; an output stage including at least one first controllable semiconductor element, a third input terminal coupled to the first inductive element such that the first inductive element is coupled between the first output terminal and the third input terminal, a fourth input terminal coupled to the second output terminal, a third output terminal, and a fourth output terminal; a second controllable semiconductor element and a first capacitive element coupled in series and between a first common node coupled between the first inductive element and the third input terminal, and a second common node coupled between the second output terminal and the fourth input terminal; and a first diode element coupled in parallel to the second controllable semiconductor element.

Semiconductor module arrangement with fast switching, reduced losses, and low voltage overshoot and method for operating the same

A power semiconductor module includes a power electronics circuit and a measuring circuit for measuring a physical parameter occurring in the power electronics circuit and for providing a corresponding measurement signal. A transmission circuit is coupled to a secondary side of a transfer unit, and an evaluation circuit is coupled to the primary side and galvanically isolated from the transmission circuit by the transfer unit. The evaluation circuit supplies an AC voltage to the primary side, causing primary current to flow on the primary side, which in turn results in secondary current on the secondary side, the secondary current being supplied to the transmission circuit. The transmission circuit receives the measurement signal and modulates the secondary current in accordance with the measurement signal, which results in a modulation of the primary current. The evaluation circuit evaluates the modulation of the primary current and generates an output signal dependent thereon.

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Soest, Germany

Michael Schlueter