1. Infineon Technologies Ag (15 from 14,705 patents)

2. Other (1 from 832,680 patents)

3. Qimonda Ag (555 patents)

1. 7426669 - Circuit arrangement and method for driving electronic chips

2. 7117403 - Method and device for generating digital signal patterns

3. 7117404 - Test circuit for testing a synchronous memory circuit

4. 7062690 - System for testing fast synchronous digital circuits, particularly semiconductor memory chips

5. 6957373 - Address generator for generating addresses for testing a circuit

6. 6897646 - Method for testing wafers to be tested and calibration apparatus

7. 6871306 - Method and device for reading and for checking the time position of data response signals read out from a memory module to be tested

8. 6865707 - Test data generator

9. 6862702 - Address counter for addressing synchronous high-frequency digital circuits, in particular memory devices

10. 6839397 - Circuit configuration for generating control signals for testing high-frequency synchronous digital circuits

11. 6744272 - Test circuit

12. 6724181 - Method of calibrating a test system for semiconductor components, and test substrate

13. 6721904 - System for testing fast integrated digital circuits, in particular semiconductor memory modules

14. 6618305 - Test circuit for testing a circuit

15. 6556492 - System for testing fast synchronous semiconductor circuits