Intel Corporation

Michael Sandhinti

Stephen R Mooney

Sanjay Dabral

James A McCall

Aaron K Martin

Matthew B Haycock

Hing Yan To

Keith M Self

Jonathan Nick Spitz

A method and system for a configurable Vcc reference and Vss reference differential current mode transmitter is described. The system includes a Vss reference differential current mode driver, a Vcc reference differential current mode driver coupled to the Vss reference current mode driver, and a controller circuit coupled to the Vss reference differential current mode driver and the Vcc reference differential current mode driver to select between the Vss reference differential current mode driver and the Vcc reference differential current mode driver based on a type of transmission interface.

Method and system for a configurable Vcc reference and Vss reference differential current mode transmitter

A method and apparatus for detecting data strobe errors. A strobe error detection circuit has a strobe input and a counter coupled to the strobe input to count strobe pulses received. The circuit also has a comparator to determine if a strobe error has occurred based on the magnitude of the difference between a first count of strobe pulses and a second count of strobe pulses. In an embodiment, the first count is read from a memory location at a first time and the second count is read at a second time.

Method and apparatus for detecting strobe errors

A variable-delay circuit on an integrated circuit is used to delay a periodic strobe signal. In normal operation, the strobe signal can be shifted 90 degrees to center it within a data bit cell. In test mode, it can also be shifted up to 270 degrees in N increments to measure the effective input latch setup and hold timings. The variable-delay circuit comprises a voltage-mixing interpolator circuit to produce phase delays in N increments. The variable-delay circuit can incorporate an existing delay locked loop. Also described are an electronic system, a data processing system, and various methods of performing on-chip testing and calibration.

Digital variable-delay circuit having voltage-mixing interpolator and methods of testing input/output buffers using same

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Olympia, WA, United States of America

Michael Sandhinti