Suvolta, Inc.

Mie Fujitsu Semiconductor Limited

Intelleflex Corporation

Michael S McGregor

Lawrence T Clark

David Anthony Kidd

Robert Rogenmoser

Augustine Kuo

An integrated circuit can include a plurality of drive monitoring sections, each including at least one transistor under test (TUT) having a source coupled to a first power supply node, a gate coupled to receive a start indication, and a drain coupled to a monitor node, at least one monitor capacitor coupled to the monitor node, and a timing circuit configured to generate a monitor value corresponding to a rate at which the TUT can transfer current between the monitor node and the first power supply node; and a body bias circuit configured to apply a body bias voltage to at least one body region in which at least one transistor is formed; wherein the body bias voltage is generated in response to at least a plurality of the monitor values.

Body bias circuits and methods

A Radio Frequency Identification (RFID) system according to one embodiment includes communication circuitry for enabling wireless communication with an RF reader; energy harvesting circuitry for generating an electric current from RF energy; a sensor loop coupled to the energy harvesting circuitry; and a status register coupled to the sensor loop for indicating a broken or unbroken status of the sensor loop. A method according to one embodiment includes generating an electric current in a Radio Frequency Identification (RFID) device, the current energizing a sensor loop; detecting a status of whether the sensor loop is broken or unbroken; storing the status in at least one of a status register and a nonvolatile memory; receiving a query from an RFID reader for the status; and sending the status to the RFID reader.

RF device with tamper detection

An integrated circuit can include an operational section comprising a first body bias circuit coupled to drive first body regions to a first bias voltage in response to at least first bias values; a second body bias circuit coupled to drive second body regions to a second bias voltage in response to at least second bias values; a plurality of monitoring sections formed in a same substrate as the operational section, each configured to output a monitor value reflecting a different process variation effect on circuit performance.

Growing community of inventors

Morgan Hill, CA, United States of America

Michael S McGregor