International Business Machines Corporation

Michael Richard Quellette

Steven Michael Douskey

Steven Frederick Oakland

Anthony D Polson

Rudolf Adriaan Haring

Paul Gregory Crumley

Thomas B Chadwick, Jr

Theodoros Anemikos

Rahul K Nadkarni

Arthur A Bright

Scott A Strissel

Marc B Dombrowa

Eric Jasinski

Tari S Gordon

A method for detecting which of two clock signals is the first to arrive may include providing a sense amplifier comprising first and second nodes located on first and second legs thereof. The sense amplifier is configured such that the first and second nodes have a substantially equivalent initial voltage. The method then includes receiving first and second clock signals. The sense amplifier is configured such that the voltage of the first node increases and the voltage of the second node decreases if the first clock signal arrives before the second clock signal. Similarly, the sense amplifier is configured such that the voltage of the second node increases and the voltage of the first node decreases if the second clock signal arrives before the first clock signal. The method may further include sampling the voltage of at least one of the first and second nodes to determine which of the first and second clock signals was the first to arrive.

Clock-skew tuning apparatus and method

A design structure for repairing an integrated circuit during operation of the integrated circuit. The integrated circuit comprising of a multitude of memory arrays and a fuse box holding control data for controlling redundancy logic of the arrays. The design structure provides the integrated circuit with a control data selector for passing the control data from the fuse box to the memory arrays; providing a source of alternate control data, external of the integrated circuit; and connecting the source of alternate control data to the control data selector. The design structure further passes the alternate control data from the source thereof, through the control data selector and to the memory arrays to control the redundancy logic of the memory arrays.

Design structure for in-system redundant array repair in integrated circuits

A method and structure for improving a content addressable memory array has a plurality of serially connected memory sub-arrays (which include at least one memory cell), a matchline connected to each of the sub-arrays, a valid memory cell, a comparator receiving input from the matchline and valid memory cell, a sinkline output from the comparator, and a precharge device. The sinkline and matchline are reset from a first voltage to a second voltage depending upon the results of a compare operation of the input data to the data in the storage device. When the second voltage appears on the matchline and the first voltage appears on the sinkline this indicates a match between the data within all of the sub-arrays and the input data.

Saving content addressable memory power through conditional comparisons

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Westford, VT, United States of America

Michael Richard Quellette