The Perkin-Elmer Corporation

Michael R Nelson

Jerry E Cahill

Roy E Boostrom

Tzong Hwang

This invention is directed to a digital wavelength calibration system for a spectrophotometer, which includes a photodiode array that forms an output detector for the spectrophotometer, a light source for generating at least one reference emission line of known peak wavelength, a computer controlled mechanism for causing the peak of said reference line to fall in close proximity to the center of a preselected pixel of said photodiode array, peak location computing apparatus for computing the exact position data of the peak relative to the pixel center in terms of the pixel spacing and the ordinal number of the preselected pixel and for retaining this position data for subsequent wavelength computation, wavelength identification computing apparatus for computing the numerical relationship data of the ordinate number of each pixel to the wavelength falling on that pixel and for retaining this relationship data for subsequent correlation with data generated by the pixel, and apparatus for computational processing and display of the data correlated with the associated wavelength value.

Automatic digital wavelength calibration system for a spectrophotometer

Output data from a spectrophotometer may be presented as a series of data values representative of the intensity amplitude of pass bands having equal bandwidths (resolution) and spaced at wavelength intervals equal to the bandwidth. For some purposes it is desirable to increase the bandwidth of said data, and this invention discloses method and apparatus for converting such data to equivalent data having a selected greater bandwidth.

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Downers Grove, IL, United States of America

Michael R Nelson