Kabushiki Kaisha Toshiba

General Electric Company

Plessey Handel Und Investments A.g.

Cambridge University Technical Services Limited

Cambridge Enterprise Limited

Michael Pepper

Alexander Giles Davies

Rene Wirtz

Anton Peter Jacob Middelberg

Christoph Walti

Anke Husmann

Derek H Roberts

The present invention provides a method of forming coatings of at least two different coating molecules on at least two electrodes, the method comprising: (a) providing an array of at least two individually-addressable electrodes, (b) allowing a layer of a masking molecule to adsorb onto all electrodes, (c) inducing electrochemical desorption of the masking molecule from at least one but not all electrodes to expose a first set of exposed electrodes, (d) allowing a first coating molecule to adsorb onto the first set of exposed electrodes, (e) exposing all electrodes to a masking molecule to allow adsorption of the masking molecule onto all electrodes, (f) inducing electrochemical desorption of masking molecule from a second set of electrodes to expose a second set of exposed electrodes, (g) allowing a second coating molecule to adsorb onto the second set of exposed electrodes.

Arrays of electrodes coated with molecules and their production

A sensor comprises a reference sample arranged to be subject to at least one variable physical parameter such that a variation in the value of the at least one variable physical parameter causes a change in the magnetisation of the reference sample, means for measuring the magnetisation of the reference sample, and means for determining in dependence upon the measured magnetisation whether there has been a variation in the value of the at least one variable physical parameter, wherein the reference sample comprises a Heusler alloy.

Magnetic devices

A data storage device comprising a planar integrated circuit (13) formed on a face of a body of an electronic storage material which provides a plurality of spaced discrete columns of spaced discrete electric charge storage sites (5), the columns extending in directions normal to the plane of the intergrated circuit and the integrated circuit providing access to the storage sites.

Data storage devices with vertical charge transfer

A method of testing a field effect device for radiation hardness. The method comprises the steps of subjecting the field effect device to a low temperature environment, developing a first set of data points by measuring the conductance of the field effect device as a function of gate voltage at a first substrate bias, developing a second set of data points by measuring the conductance of the field effect device as a function of gate voltage at a second substrate bias, which is different from the first substrate bias, and comparing the first and second sets of data points to obtain an assessment of radiation hardness.

Radiation hardness testing for field effect devices

Growing community of inventors

Cambridge, United Kingdom

Michael Pepper