Markem-imaje Corporation

Markem Corporation

Marken-imaje Corporation

Michael P Secord

Richard C Woudenberg

Richard J Larson, Jr

Joyce Bemis

James W Foley

Benjamin J Brown

Ann Benjamin

David H Blank

This disclosure relates to compounds of formula (I), as well as related ink compositions and printing methods: In formula (I), L, X, R, and Rare defined in the specification.

Urethane compounds

This disclosure relates to an ink composition (e.g., a hot melt ink composition or a radiation curable ink composition) that has a relatively low conductivity. This disclosure also relates to a continuous printing process using such a composition and a product containing such a composition.

Ink compositions

This disclosure includes a hot melt ink composition that includes at least one wax having a freezing point of from about 20&#xb0; C. to about 45&#xb0; C. and a melting point of at least about 35&#xb0; C., and at least one colorant. The composition includes at least about 50 wt % of the at least one wax. This disclosure also relates to a printing process using such a composition and a product containing such a composition.

Hot melt inks

Methods are disclosed that include directing electromagnetic radiation and/or heat to a structure, the structure including a substrate, a first layer, and a marking composition between the substrate and the first layer. At least a portion of the electromagnetic radiation and/or heat is transmitted through the first layer and the structure is marked.

Methods of marking and related structures and compositions

A method of marking a substrate includes contacting the substrate with a composition and contacting the composition with energy sufficient to produce a change in the composition that can be detected optically. In some embodiments, the change produces a white mark.

Marking substrates

A marking composition includes a polymerizable first material that comprises silicon and a second material capable of extending polymeric chains of the first material, wherein the marking composition is capable of undergoing a change that can be detected optically when the composition is contacted with energy.

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West Chesterfield, NH, United States of America

Michael P Secord