International Business Machines Corporation

Michael P Grace

Donato Orazio Forlenza

Orazio Pasquale Forlenza

Bryan J Robbins

A method, system, and computer program product to test a semiconductor device are described. The method includes receiving a set of test patterns for testing the semiconductor device and a user selecting a subset of the set of test patterns. The method also includes cataloging a content of pattern files associated with the subset of the set of test patterns to generate a catalog, and processing the catalog to output test data to the semiconductor device.

Selective test pattern processor

A method, system, and computer program product to test a semiconductor device are described. The system includes an input interface to receive a set of test patterns to test the semiconductor device and a user selection corresponding to a subset of the set of test patterns. The system also includes a processor to process the subset of the set of test patterns to output test data to the semiconductor device.

Growing community of inventors

Waltham, VT, United States of America

Michael P Grace