International Business Machines Corporation

Michael Normand Goulet

James Douglas Warnock

Sam Gat-Shang Chu

Joachim Gerhard Clabes

Bruce Martin Fleischer

David S Levitan

Thomas Edward Rosser

Nicholas R Orzol

Johnny J Leblanc

Branch prediction in a computer processor, includes: fetching an instruction, the instruction comprising an address, the address comprising a first portion of a global history vector and a global history vector pointer; performing a first branch prediction in dependence upon the first portion of the global history vector; retrieving, in dependence upon the global history vector pointer, from a rolling global history vector buffer, a second portion of the global history vector; and performing a second branch prediction in dependence upon a combination of the first portion and second portion of the global history vector.

Branch prediction in a computer processor

A method and apparatus for reducing power consumption of a clocked circuit containing a plurality of latches is provided. A first latch, within the plurality of latches, is located which has more than a predetermined slack. The possibility of substituting an available second latch, that requires less power to operate, is then determined, subject to the constraint that the slack after substitution should still be positive, although it may be less than the predetermined number mentioned above. Where such a possibility is determined to exist, the first latch is then replaced with the available second latch.

Method of power consumption reduction in clocked circuits

A device for fault testing in a microprocessor chip provides a LBIST circuit which has a first reference signature. A loading unit is further provided for receiving and outputting a set of masking data. A file unit connected to the loading unit is yet further provided for receiving the masking data. A masking unit connected to the file unit is yet further provided for generating a second reference signature based on the masking data from the file unit and a scanning data from a scan string in the chip. And, a signature logic connected to the output of the masking unit is yet further provided for compressing the second reference signature and inputting the compressed second reference signature to the LBIST circuit, wherein the compressed second reference signature replaces the first reference signature.

Enhanced debug scheme for LBIST

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Austin, TX, United States of America

Michael Normand Goulet