Visotec Gmbh

Michael Münst

Peter Koch

Gereon Hüttmann

Helge Sudkamp

Dierck Hillmann

Hendrik Spahr

The invention relates to a full-field OCT method for generating an imaging of an ocular fundus (), in which short-coherent light () is emitted and split into an object beam path () and a reference beam path (). The object beam path () is directed onto the ocular fundus (). The reference beam path () and a portion of the object beam path () reflected by the ocular fundus () are directed onto an image sensor (), such that an interference between the reference beam path () and the object beam path () occurs on the image sensor (), wherein the reference beam path () impinges on the image sensor () at an angle deviating from the object beam path (). Before impinging on the image sensor (), the reference beam path () impinges on an optical correction element () in order to reduce a chromatic aberration within the reference beam path (). Intensity information and phase information is determined from a capturing of the image sensor. A focus-adjusted image of the ocular fundus is calculated. The invention also relates to a system that is suitable for carrying out said method. Images of the ocular fundus can be captured without the beam path being previously adapted to the refractive power of the eye lens.

Full-field OCT method and system for generating an imaging of an ocular fundus

The invention relates to a method for creating a two-dimensional interferogram with a Michelson-type free-beam interferometer, comprising an extended, partially spatially coherent light source and a two-dimensional light detector, wherein light from the light source is split by a beam splitter with a semitransparent beam splitter mirror into a sample light beam and a reference light beam and taken to a sample arm and a reference arm, wherein the sample light beam returning from a sample is directed by the beam splitter mirror onto the light detector, wherein the reference light beam emerging from the reference arm makes a predetermined angle greater than zero with the sample light beam on the light detector, and wherein the length of the reference arm is variable, where the reference light beam is directed by means of an odd number of reflections in each reflection plane in at least one reference arm section so that it is displaced laterally to itself and travels antiparallel through a light-deflecting element working by refraction or diffraction which is secured at the exit of the reference arm.

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Lübeck, Germany

Michael Münst