Micromass UK Limited

Waters Technologies Ireland Limited

Michael McCullagh

Steven Derek Pringle

Michael Raymond Morris

Jeffrey Goshawk

Christopher Carver

Stephen Smith

David Eatough

Andrew Golding

Gareth Rhys Jones

Alastair Murray Booth

Hans Vissers

Russell Julian Mortishire-Smith

Techniques and apparatus for determining atomic-level configurations of product ions are described. In some embodiments, product ion CCS information may be used to determine substructural configurations of product ions, such as isomers. For example, in one embodiment, an apparatus may include at least one memory and logic coupled to the at least one memory to: receive analytical information for a plurality of product ions, the analytical information comprising product ion collision cross-section (CCS) information, for at least one product ion of the plurality of product ions, determine a variance value of the product ion CCS information. Other embodiments are described.

Techniques for sample analysis using product ion collision-cross section information

A method of mass spectrometry is disclosed comprising repeatedly or continuously causing first analyte sample to be released or ejected from a first sample. A determination is made as to whether or not a quality threshold such as an intensity threshold has been met or exceeded, wherein if the quality threshold has been met or exceeded then the method further comprises repeatedly or continuously causing second analyte sample to be released or ejected from a second sample.

Data acquisition technique for rapid sampling

A method of screening a sample for at least one compound of interest is disclosed. The method comprises comparing the ion mobility and at least one further physicochemical property of the ions of a compound of interest to the same properties of candidate ions in the sample. The properties of the compound of interest are matched to those of a candidate ion in the sample then the sample may be determined to comprise the compound of interest.

Method of screening samples

A method of detecting one or more compounds, chemicals or contaminants in a substrate by mass spectrometry is disclosed. A non-living substrate is analyzed by contacting the substrate with a diathermy knife. An electric current is applied to the diathermy knife such that the diathermy knife vaporizes a portion of the substrate. The vapor is aspirated via a sampling tube pumped by a venturi pump into a vacuum chamber of a mass spectrometer. Analyte molecules are aspirated into the vacuum chamber whereupon they impact a surface of the vacuum chamber and are ionized to form analyte ions which are then mass analyzed.

Diathermy knife ionisation source

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Northwich, United Kingdom

Michael McCullagh