Northrop Grumman Systems Corporation

Michael L Marable

Gerald Pray Griffith

Gary Stewart Kanner

Ronald Kenneth Meyer, Jr

A method to determine at least one characteristic of a material having a spatially modulated nonlinear susceptibility includes measuring scattered light in response to an incident beam provided to at least one surface of the material. An indication of patterning of the material is determined based on the measured scattered light.

Optical method and system for analyzing or inspecting patterned materials

The present invention relates generally to an apparatus that increases the conversion efficiency of optical parametric oscillators and also reduces overall system size and susceptibility to vibration. The first embodiment of the present invention incorporates a PPLN OPO architecture which includes mirrored coatings on the entry surface area and exit surface area of a monolithic nonlinear optical medium. The coatings act as mirrors, however, the mirrors are actually affixed to the PPLN element. In the first embodiment of the present invention, the PPLN element is a dual grated element. The second embodiment of the present invention uses a single grated PPLN element.

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Crystal Lake, IL, United States of America

Michael L Marable