Growing community of inventors

Berlin, Germany

Michael Kieweg

Average Co-Inventor Count = 2.48

ph-index = 1

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 6

Michael KiewegFlorian Kuhlmann (6 patents)Michael KiewegChristian Schäfer (3 patents)Michael KiewegSaurabh Shekhar Verma (2 patents)Michael KiewegIngo Kleppe (1 patent)Michael KiewegRalf Netz (1 patent)Michael KiewegYauheni Novikau (1 patent)Michael KiewegChristoph Nieten (1 patent)Michael KiewegThomas Mohr (1 patent)Michael KiewegTorsten Sievers (1 patent)Michael KiewegMichael Kieweg (10 patents)Florian KuhlmannFlorian Kuhlmann (7 patents)Christian SchäferChristian Schäfer (6 patents)Saurabh Shekhar VermaSaurabh Shekhar Verma (3 patents)Ingo KleppeIngo Kleppe (50 patents)Ralf NetzRalf Netz (42 patents)Yauheni NovikauYauheni Novikau (28 patents)Christoph NietenChristoph Nieten (26 patents)Thomas MohrThomas Mohr (12 patents)Torsten SieversTorsten Sievers (5 patents)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Leverton Holding, LLC (7 from 10 patents)

2. Carl Zeiss Microscopy Gmbh (2 from 705 patents)

3. Carl Zeiss Meditec Ag (1 from 767 patents)


10 patents:

1. 11869259 - Text line image splitting with different font sizes

2. 11704476 - Text line normalization systems and methods

3. 11687719 - Post-filtering of named entities with machine learning

4. 11450125 - Methods and systems for automated table detection within documents

5. 11151371 - Text line image splitting with different font sizes

6. 11062164 - Text line normalization systems and methods

7. 10936820 - Post-filtering of named entities with machine learning

8. 10130248 - Method for realizing ocular fundus photographs that are corrected for scattered light

9. 10048481 - Scanning microscope and method for determining the point spread function (PSF) of a scanning microscope

10. 8837795 - Microscopy of several samples using optical microscopy and particle beam microscopy

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12/25/2025
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