Corning Incorporated

Michael Joseph Litzenberger

Christopher Alan Lee

John Weston Frankovich

A compound common-path interferometer including first and second measurement arms for measuring a test object is arranged so that a reference optic of the first measurement arm is disconnected from a remainder of the first measurement arm and a coupling between the reference optics of the first and second measurement arms forms a monolithic measurement cavity for maintaining reference surfaces of the reference optics at a fixed spacing and orientation. Separate supports are provided for the monolithic measurement cavity and the remainder of the first measurement arm.

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Fairport, NY, United States of America

Michael Joseph Litzenberger