Teraview Limited

Enigma Diagnostics Limited

Michael John Withers

Bryan Edward Cole

David James Squirrell

Trevor John Beckett

Martin Lee

Brian Robertson

Christopher John Silk

Julian Alexander Cluff

Vincent Patrick Wallace

Martin Alan Lee

Ian V Bradley

John Baker

Ian Vincent Bradley

A THz radiation probe () for examining an object (), the probe comprising a first portion configured to be inserted into an opening of said object in a first direction (), said probe further comprising at least one THz emitter (), directing means () for directing THz radiation emitted from said emitter to said object via an aperture () located at said first portion and subsequently from said object to at least one THz detector () and, means for scanning said emitted THz radiation across said object in a scan direction, said scan direction having a component in said first direction ().

Scanning terahertz probe

Method and apparatus for investigating a sample particularly a pharmaceutical tablet. An emitter and/or the sample are initially positioned so that the emitter is at a predetermined distance and normal angle to a first point on a surface of the sample. The emitter then irradiates the sample with radiation having a plurality of frequencies in the range from 25 GHz to 100 THz at a plurality of points on the surface of the sample. Relative motion is possible between the emitter and the sample so that the surface of the sample can be tracked to maintain the predetermined distance and normal angle at each of the plurality of points, and allow radiation transmitted and/or reflected from the sample at the plurality of points to be detected. This has particular application to imaging the structure or composition of a coating on a pharmaceutical tablet.

Method and apparatus for investigating a non-planar sample

A sample delivery system comprising (i) a cartridge comprising a body section adapted to hold a sealed sample vessel so as to fix the position of a seal of the sample vessel in relation to the cartridge; and (ii) apparatus adapted to receive said cartridge, said apparatus being provided with an opening system for opening said sealed sample vessel contained within the cartridge.

Sample processor

An apparatus for varying the path length of a beam of radiation, the apparatus comprising: an element () rotatably mounted about an axis, said element comprising two reflective surfaces in fixed relation to one another such that radiation may be reflected between said reflective surfaces and out of the element (); and driving means () for rotatably oscillating said element about said axis.

Apparatus for varying the path length of a beam of radiation

Growing community of inventors

Cambridge, United Kingdom

Michael John Withers