Omicron Electronics Gmbh

Michael Jochum

Stephan Geiger

Rainer Kueng

Rainer Küng

Fred Steinhauser

Rainer Kung

Tal Yehieli

Test device having a signal input with a positive pin and a negative pin, between which an-input signal may be applied. Test device has a separation unit which is connected to the positive pin and to the negative pin and is configured to separate a positive signal component in the form of a positive track from the input signal, to output said signal component at a first pin, to separate a negative signal component in the form of a negative track from the input signal and to output said signal component at a second pin. The use of the test device to test a control unit of the switching device is described, wherein the test device simulates the switching device, the signal input of the test device is connected to the control unit and the control unit outputs an input signal to the signal input.

Test device for testing a control unit of a switching apparatus of a switchgear

A testing device for testing a control unit of a switching device of an electrical switchgear installation. The testing device has a signal input, and to which a controlled current sink is provided, which is connected to the signal input. The controlled current sink shunts an input current from the signal input in order to provide a dynamically adjustable input impedance. A method for testing a control unit of a switching device of a switchgear installation, includes the testing device having a signal input, to which an input voltage may be applied. In the testing device, a controlled current sink shuts an input current from the signal input and thus provides a dynamically adjustable input impedance.

Testing device and method for testing a control unit of a switching device of a switchgear installation

In order to test substations from different manufacturers and of different types in a simple manner, it is provided that a control unit () for a switching device () of a substation () is connected via an adapter cable () to a test device (), which simulates the switching device () for the test and the test device () reads configuration-specific data from a memory unit () on the adapter cable () and the test unit () thus configures its signal inputs (BE) and signal outputs (BA, AA) that are required for conducting the test.

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Altach, Austria

Michael Jochum