Intel Corporation

Michael J Wiznerowicz

Sivakumar Radhakrishnan

Jed D Griffin

Jason Sandri

Scott R Rushford

Sean T Baartmans

Ruben Ramirez

Kapilan Maheswaran

David J Hotz

In one embodiment, the present invention is directed to a logic analyzer such as may be implemented on a system-on-chip or another semiconductor device. The analyzer can include multiple lanes each having a filter to receive and filter debug data, a compressor to compress the debug data passed by the filter, a buffer, and a controller to store the compressed debug data into the buffer, where the compressed debug data can be stored without timing information. Other embodiments are described and claimed.

Providing an on-die logic analyzer (ODLA) having reduced communications

Thermal control for a controller in a data processing environment is described. In one embodiment, the invention includes detecting a temperature of a semiconductor device at a thermal sensor on the semiconductor device, comparing the detected temperature to a threshold, and generating a high interrupt if the temperature is above the threshold and a low interrupt if the temperature is below the threshold.

On-die temperature monitoring in semiconductor devices to limit activity overload

Growing community of inventors

Hillsboro, OR, United States of America

Michael J Wiznerowicz