Growing community of inventors

Chenango Forks, NY, United States of America

Michael J Riess

Average Co-Inventor Count = 2.89

ph-index = 3

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 118

Michael J RiessWayne Blackwell (3 patents)Michael J RiessBruce A Williams (3 patents)Michael J RiessMark Gaug (3 patents)Michael J RiessJohn F Hartman (2 patents)Michael J RiessDavid Bailey (2 patents)Michael J RiessBryan Dalton (2 patents)Michael J RiessMichael W Finney (2 patents)Michael J RiessPeter J Dugan (2 patents)Michael J RiessJonathan Wee (2 patents)Michael J RiessThomas Erb (2 patents)Michael J RiessClifford Solowiej (2 patents)Michael J RiessGerald Sensenig (2 patents)Michael J RiessWilliam Olver (2 patents)Michael J RiessJamie Micha (2 patents)Michael J RiessMatthew Bossard (2 patents)Michael J RiessPatrick Ouellette (2 patents)Michael J RiessDavid K Brown (1 patent)Michael J RiessAlfred T Rundle (1 patent)Michael J RiessLawrence E Albertelli (1 patent)Michael J RiessSteven J Pratt (1 patent)Michael J RiessJoseph W Porter (1 patent)Michael J RiessJohn Nasakaitis (1 patent)Michael J RiessJamie R Swetland (1 patent)Michael J RiessDavid Benninger (1 patent)Michael J RiessJohn Patrick (1 patent)Michael J RiessKevin Zimmer (1 patent)Michael J RiessFrank Sweet (1 patent)Michael J RiessLeslie Scrivener (1 patent)Michael J RiessKalon Riehle (1 patent)Michael J RiessAlexander M Elhage (1 patent)Michael J RiessDaniel Ondreyko (1 patent)Michael J RiessKenneth Marks (1 patent)Michael J RiessJohn Nasakaitus (1 patent)Michael J RiessJamie Swetland (0 patent)Michael J RiessJohn Nasakiatus (0 patent)Michael J RiessBruce Willams (0 patent)Michael J RiessJohn Hartman (0 patent)Michael J RiessMichael J Riess (8 patents)Wayne BlackwellWayne Blackwell (19 patents)Bruce A WilliamsBruce A Williams (9 patents)Mark GaugMark Gaug (8 patents)John F HartmanJohn F Hartman (13 patents)David BaileyDavid Bailey (12 patents)Bryan DaltonBryan Dalton (6 patents)Michael W FinneyMichael W Finney (6 patents)Peter J DuganPeter J Dugan (5 patents)Jonathan WeeJonathan Wee (3 patents)Thomas ErbThomas Erb (3 patents)Clifford SolowiejClifford Solowiej (3 patents)Gerald SensenigGerald Sensenig (3 patents)William OlverWilliam Olver (3 patents)Jamie MichaJamie Micha (3 patents)Matthew BossardMatthew Bossard (3 patents)Patrick OuellettePatrick Ouellette (3 patents)David K BrownDavid K Brown (51 patents)Alfred T RundleAlfred T Rundle (12 patents)Lawrence E AlbertelliLawrence E Albertelli (10 patents)Steven J PrattSteven J Pratt (6 patents)Joseph W PorterJoseph W Porter (6 patents)John NasakaitisJohn Nasakaitis (5 patents)Jamie R SwetlandJamie R Swetland (4 patents)David BenningerDavid Benninger (4 patents)John PatrickJohn Patrick (2 patents)Kevin ZimmerKevin Zimmer (2 patents)Frank SweetFrank Sweet (2 patents)Leslie ScrivenerLeslie Scrivener (2 patents)Kalon RiehleKalon Riehle (2 patents)Alexander M ElhageAlexander M Elhage (2 patents)Daniel OndreykoDaniel Ondreyko (2 patents)Kenneth MarksKenneth Marks (2 patents)John NasakaitusJohn Nasakaitus (1 patent)Jamie SwetlandJamie Swetland (0 patent)John NasakiatusJohn Nasakiatus (0 patent)Bruce WillamsBruce Willams (0 patent)John HartmanJohn Hartman (0 patent)
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Inventor’s number of patents
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Strength of working relationships

Company Filing History:

1. Lockheed Martin Corporation (8 from 5,266 patents)


8 patents:

1. 10896482 - Slice scan imaging system and methods of use

2. 10244149 - Imaging system with scan line titled off focal plane

3. 9758315 - Facility wide mixed mail sorting and/or sequencing system and components and methods thereof

4. 9751111 - Facility wide mixed mail sorting and/or sequencing system and components and methods thereof

5. 8457781 - Facility wide mixed mail sorting and/or sequencing system and components and methods thereof

6. 7463783 - Constant magnification imaging method and system

7. 7162098 - System and method for increasing temporal and spatial capacity of systems that amplitude quantize data prior to processing

8. 6484066 - Image life tunnel scanner inspection system using extended depth of field technology

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