Sun Microsystems, Inc.

Michael J Parks

Terrence Barr

Eran Davidov

Jamie D Riggs

David C Gurchinoff

Douglas M Priest

A test apparatus including a data interface configured to couple with at least one of a test device and a baseline device, and a computing device configured to perform a method including performing a first benchmark on a baseline device for a predetermined time interval, resulting in a first dataset representing work performed by the baseline devices, performing a second benchmark on a test device for the predetermined time interval resulting in a second dataset representing work performed by the test device, and using a heuristic including a number of tests to determine whether the test device has an acceptable level of performance relative to the baseline device.

Apparatus for comparing performance of electronic devices

A method for evaluating portable electronic devices includes performing a first benchmark on a baseline device for a predetermined time interval, resulting in a first dataset representing work performed by the baseline device. The method further includes performing a second benchmark on a test device for the predetermined time interval resulting in a second dataset representing work performed by the test device. Finally, the test device is determined to be initially acceptable if the total amount of work performed by the test device and the total amount of work performed by the baseline device differ by less than an acceptance threshold, and is determined to be finally acceptable by performing a quotient test on the data.

Method and apparatus for comparing performance of electronic devices

In a computer system, a method and system for verifying whether a floating-point logic unit correctly directly rounds floating-point numbers when conducting multiplication, square root, and division operations. A bit sequence that represents a directed boundary condition for a mathematical operation is identified. This sequence is then recast in terms of a series of integer equations. A recurrence is used to solve these equations to produce difficult test data. When solving the equations, any intermediate terms that exceed the computer's precision are discarded. The logic then conducts the mathematical operation under inspection using the test cases. The logic's computed value is then compared to an expected value. If the computed value equals the expected value, the logic has accurately performed the operation. If not, the logic is faulty.

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Michael J Parks